name:-0.0071368217468262
name:-0.078339099884033
name:-0.00056099891662598
Luxtron Corporation Patent Filings

Luxtron Corporation

Patent Applications and Registrations

Patent applications and USPTO patent grants for Luxtron Corporation.The latest application filed is for "in situ optical surface temperature measuring techniques and devices".

Company Profile
0.61.4
  • Luxtron Corporation -
  • Luxtron Corporation - Santa Clara CA
  • Luxtron Corporation - Campbell CA
  • Luxtron Corporation - Mountain View CA
  • Luxtron Corporation - Menlo Park CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
In Situ Optical Surface Temperature Measuring Techniques And Devices
App 20080225926 - Gotthold; John P. ;   et al.
2008-09-18
In situ optical surface temperature measuring techniques and devices
Grant 7,374,335 - Gotthold , et al. May 20, 2
2008-05-20
In situ optical surface temperature measuring techniques and devices
Grant 7,080,940 - Gotthold , et al. July 25, 2
2006-07-25
In situ optical surface temperature measuring techniques and devices
App 20060140248 - Gotthold; John P. ;   et al.
2006-06-29
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
Grant 7,042,581 - Schietinger , et al. May 9, 2
2006-05-09
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
Grant 6,934,040 - Schietinger , et al. August 23, 2
2005-08-23
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
App 20050105103 - Schietinger, Charles W. ;   et al.
2005-05-19
In situ optical surface temperature measuring techniques and devices
App 20040258130 - Gotthold, John P. ;   et al.
2004-12-23
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
Grant 6,654,132 - Schietinger , et al. November 25, 2
2003-11-25
In situ optical surface temperature measuring techniques and devices
Grant 6,572,265 - Gotthold , et al. June 3, 2
2003-06-03
Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
Grant 6,570,662 - Schietinger , et al. May 27, 2
2003-05-27
Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
Grant 6,426,232 - Litvak July 30, 2
2002-07-30
Liquid etch endpoint detection and process metrology
Grant 6,406,641 - Golzarian June 18, 2
2002-06-18
Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
Grant 6,110,752 - Litvak August 29, 2
2000-08-29
Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
Grant 6,077,452 - Litvak June 20, 2
2000-06-20
In situ technique for monitoring and controlling a process of chemical-mechanical-polishing via a radiative communication link
Grant 6,010,538 - Sun , et al. January 4, 2
2000-01-04
Electro optical board assembly for measuring the temperature of an object surface from infra red emissions thereof including an automatic gain control therefore
Grant 5,897,610 - Jensen April 27, 1
1999-04-27
Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
Grant 5,891,352 - Litvak April 6, 1
1999-04-06
Interference removal
Grant 5,786,886 - Litvak , et al. July 28, 1
1998-07-28
Non-contact optical techniques for measuring surface conditions
Grant 5,769,540 - Schietinger , et al. June 23, 1
1998-06-23
Electro-optical board assembly for measuring the temperature of an object surface from infra-red emissions thereof, including an automatic gain control therefore
Grant 5,717,608 - Jensen February 10, 1
1998-02-10
Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
Grant 5,695,660 - Litvak December 9, 1
1997-12-09
Temperature measuring system having improved signal processing and multiple optical sensors
Grant 5,600,147 - Jensen February 4, 1
1997-02-04
Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
Grant 5,499,733 - Litvak March 19, 1
1996-03-19
Non-contact optical techniques for measuring surface conditions
Grant 5,490,728 - Schietinger , et al. * February 13, 1
1996-02-13
Apparatus and method for measuring temperatures at a plurality of locations using luminescent-type temperature sensors which are excited in a time sequence
Grant 5,470,155 - Jensen November 28, 1
1995-11-28
Autocalibrating non-contact temperature measuring technique employing dual recessed heat flow sensors
Grant 5,464,284 - Rall November 7, 1
1995-11-07
Measuring system employing a luminescent sensor and methods of designing the system
Grant 5,414,266 - Sun May 9, 1
1995-05-09
Apparatus and method for monitoring a temperature using a thermally fused composite ceramic blackbody temperature probe
Grant 5,364,186 - Wang , et al. November 15, 1
1994-11-15
Processing endpoint detecting technique and detector structure using multiple radiation sources or discrete detectors
Grant 5,362,969 - Glenn November 8, 1
1994-11-08
Modular luminescence-based measuring system using fast digital signal processing
Grant 5,351,268 - Jensen , et al. September 27, 1
1994-09-27
Non-contact techniques for measuring temperature of radiation-heated objects
Grant 5,318,362 - Schietinger , et al. June 7, 1
1994-06-07
Non-contact optical techniques for measuring surface conditions
Grant 5,310,260 - Schietinger , et al. May 10, 1
1994-05-10
Endpoint and uniformity determinations in material layer processing through monitoring multiple surface regions across the layer
Grant 5,308,447 - Lewis , et al. May 3, 1
1994-05-03
Luminescent decay time measurements by use of a CCD camera
Grant 5,304,809 - Wickersheim April 19, 1
1994-04-19
Autocalibrating dual sensor non-contact temperature measuring device
Grant 5,294,200 - Rall March 15, 1
1994-03-15
Autocalibrating dual sensor non-contact temperature measuring device
Grant 5,216,625 - Rall June 1, 1
1993-06-01
Method of endpoint detection and structure therefor
Grant 5,190,614 - Leach , et al. March 2, 1
1993-03-02
Temperature measurement with combined photo-luminescent and black body sensing techniques
Grant 5,183,338 - Wickersheim , et al. February 2, 1
1993-02-02
Techniques for measuring the thickness of a film formed on a substrate
Grant 5,166,080 - Schietinger , et al. November 24, 1
1992-11-24
Non-contact techniques for measuring temperature or radiation-heated objects
Grant 5,154,512 - Schietinger , et al. October 13, 1
1992-10-13
Temperature measurement with combined photo-luminescent and black body sensing techniques
Grant 5,112,137 - Wickersheim , et al. May 12, 1
1992-05-12
Fiberoptic techniques for measuring the magnitude of local microwave fields and power
Grant 5,110,216 - Wickersheim , et al. May 5, 1
1992-05-05
Method of making a fiberoptic sensor of a microwave field
Grant 5,109,595 - Wickersheim , et al. May 5, 1
1992-05-05
Modular luminescence-based measuring system using fast digital signal processing
Grant 5,107,445 - Jensen , et al. April 21, 1
1992-04-21
Knock detector using optical fiber thermometer
Grant 5,099,681 - Dils March 31, 1
1992-03-31
Knock detector using optical fiber thermometer
Grant 5,052,214 - Dils October 1, 1
1991-10-01
Fiberoptic sensing of temperature and/or other physical parameters
Grant 4,988,212 - Sun , et al. January 29, 1
1991-01-29
Three-parameter optical fiber sensor and system
Grant 4,986,671 - Sun , et al. January 22, 1
1991-01-22
Sensors for detecting electromagnetic parameters utilizing resonating elements
Grant 4,897,541 - Phillips January 30, 1
1990-01-30
Fiberoptic sensing of temperature and/or other physical parameters
Grant 4,883,354 - Sun , et al. November 28, 1
1989-11-28
Optical system using a luminescent material sensor for measuring very high temperatures
Grant 4,859,079 - Wickersheim , et al. August 22, 1
1989-08-22
Optical temperature measurement techniques
Grant 4,789,992 - Wickersheim , et al. * December 6, 1
1988-12-06
Optical fiber probe for measuring the temperature of an ultrasonically heated object
Grant 4,785,824 - Wickersheim , et al. * November 22, 1
1988-11-22
Fiberoptic sensing of temperature and/or other physical parameters
Grant 4,752,141 - Sun , et al. June 21, 1
1988-06-21
Multi-channel fiber optic connector
Grant 4,712,864 - Ellis , et al. December 15, 1
1987-12-15
Optical sensors for detecting physical parameters utilizing vibrating piezoelectric elements
Grant 4,678,905 - Phillips July 7, 1
1987-07-07
Optical temperature measurement techniques
Grant 4,652,143 - Wickersheim , et al. March 24, 1
1987-03-24
Technique for optically measuring the temperature of an ultrasonically heated object
Grant 4,626,110 - Wickersheim , et al. December 2, 1
1986-12-02
Fiber optic thermal anemometer
Grant 4,621,929 - Phillips November 11, 1
1986-11-11
Optical temperature measurement techniques utilizing phosphors
Grant 4,560,286 - Wickersheim December 24, 1
1985-12-24
Multiplexing and calibration techniques for optical signal measuring instruments
Grant 4,558,217 - Alves December 10, 1
1985-12-10
Optical system for an instrument to detect the temperature of an optical fiber phosphor probe
Grant 4,459,044 - Alves July 10, 1
1984-07-10
Optical temperature measurement technique utilizing phosphors
Grant 4,448,547 - Wickersheim May 15, 1
1984-05-15
Optical temperature measurement technique utilizing phosphors
Grant 4,215,275 - Wickersheim July 29, 1
1980-07-29
Company Registrations

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