Lupke; Jens

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lupke; Jens.The latest application filed is for "test circuit for testing a synchronous memory circuit".

Company Profile

0.9.11

Lupke; Jens - Munchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test circuit for testing a synchronous memory circuit Grant 7,117,404 - Ernst , et al. October 3, 2	2006-10-03
Method and device for generating digital signal patterns Grant 7,117,403 - Ernst , et al. October 3, 2	2006-10-03
System for testing fast synchronous digital circuits, particularly semiconductor memory chips Grant 7,062,690 - Ernst , et al. June 13, 2	2006-06-13
Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested Grant 6,871,306 - Ernst , et al. March 22, 2	2005-03-22
Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices Grant 6,862,702 - Ernst , et al. March 1, 2	2005-03-01
Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits Grant 6,839,397 - Ernst , et al. January 4, 2	2005-01-04
System for testing fast integrated digital circuits, in particular semiconductor memory modules Grant 6,721,904 - Ernst , et al. April 13, 2	2004-04-13
System for testing fast synchronous semiconductor circuits Grant 6,556,492 - Ernst , et al. April 29, 2	2003-04-29
Component holder for testing devices and component holder system microlithography Grant 6,535,007 - Haas , et al. March 18, 2	2003-03-18
Test circuit for testing a synchronous memory circuit App 20030005361 - Ernst, Wolfgang ; et al.	2003-01-02
Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested App 20020160558 - Ernst, Wolfgang ; et al.	2002-10-31
System for testing fast synchronous digital circuits, particularly semiconductor memory chips App 20020070748 - Ernst, Wolfgang ; et al.	2002-06-13
Field-effect-controlled transistor and method for fabricating the transistor App 20020014669 - Widmann, Dietrich ; et al.	2002-02-07
System for testing fast synchronous semiconductor circuits App 20020012283 - Ernst, Wolfgang ; et al.	2002-01-31
Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices App 20020012286 - Ernst, Wolfgang ; et al.	2002-01-31
Method and device for generating digital signal patterns App 20020009007 - Ernst, Wolfgang ; et al.	2002-01-24
System for testing fast integrated digital circuits, in particular semiconductor memory modules App 20020010877 - Ernst, Wolfgang ; et al.	2002-01-24
Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits App 20020010878 - Ernst, Wolfgang ; et al.	2002-01-24
Component holder for testing devices and component holder system microlithography App 20010048314 - Haas, Hermann ; et al.	2001-12-06
Method of testing a memory cell having a floating gate App 20010024392 - Lupke, Jens ; et al.	2001-09-27

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