Luo; Haw Jyue

Patent Applications and Registrations

Patent applications and USPTO patent grants for Luo; Haw Jyue.The latest application filed is for "method for rejecting tuning disturbances to improve lamp failure prediction quality in thermal processes".

Company Profile

0.5.6

Luo; Haw Jyue - Hsinchu TW
LUO; Haw Jyue - Hsinchu City TW
Luo; Haw-Jyue - Hsin-Chu City TW
Luo; Haw-Jyue - Hsin-Chu TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for rejecting tuning disturbances to improve lamp failure prediction quality in thermal processes Grant 10,140,394 - Kommisetti , et al. Nov	2018-11-27
Apparatus and method for integrating manual and automated techniques for automated correlation in data mining Grant 9,697,470 - Iskandar , et al. July 4, 2	2017-07-04
Method For Rejecting Tuning Disturbances To Improve Lamp Failure Prediction Quality In Thermal Processes App 20160092618 - KOMMISETTI; Subrahmanyam Venkata Rama ; et al.	2016-03-31
Apparatus And Method For Integrating Manual And Automated Techniques For Automated Correlation In Data Mining App 20150302311 - ISKANDAR; Jimmy ; et al.	2015-10-22
Data Analyzing Method For A Fault Detection And Classification System App 20060048010 - Tai; Hung-En ; et al.	2006-03-02
Method and related system for semiconductor equipment early warning management Grant 6,999,897 - Tai , et al. February 14, 2	2006-02-14
Method for analyzing in-line QC test parameters Grant 6,959,252 - Tai , et al. October 25, 2	2005-10-25
Method And Related System For Semiconductor Equipment Early Warning Management App 20050203715 - Tai, Hung-En ; et al.	2005-09-15
Method For Analyzing In-line Qc Test Parameters App 20050004773 - Tai, Hung-En ; et al.	2005-01-06
Method for analyzing defect inspection parameters Grant 6,828,776 - Tai , et al. December 7, 2	2004-12-07
Method For Analyzing Defect Inspection Parameters App 20040124830 - Tai, Hung-En ; et al.	2004-07-01

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.