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High frequency lock-in thermography using single photon detectors
Grant 10,768,224 - Ramsay , et al. Sep | 2020-09-08 |
High Frequency Lock-in Thermography Using Single Photon Detectors
App 20180180670 - Ramsay; Euan ; et al. | 2018-06-28 |
Apparatus and method for optical interference fringe based integrated circuit processing
Grant 7,884,024 - Le Roy , et al. February 8, 2 | 2011-02-08 |
FIB milling of copper over organic dielectrics
Grant 7,883,630 - Makarov , et al. February 8, 2 | 2011-02-08 |
Methods and systems of performing device failure analysis, electrical characterization and physical characterization
Grant 7,842,920 - Lundquist November 30, 2 | 2010-11-30 |
FIB based open via analysis and repair
Grant 7,786,436 - Lundquist , et al. August 31, 2 | 2010-08-31 |
Apparatus and method for optical interference fringe based integrated circuit processing
Grant 7,697,146 - Le Roy , et al. April 13, 2 | 2010-04-13 |
Fib Milling Of Copper Over Organic Dielectrics
App 20090114851 - Makarov; Vladimir V. ; et al. | 2009-05-07 |
Apparatus and method for circuit operation definition
Grant 7,530,034 - Betz , et al. May 5, 2 | 2009-05-05 |
Sub-resolution Alignment Of Images
App 20080298719 - Sengupta; Madhumita ; et al. | 2008-12-04 |
Apparatus and method of forming silicide in a localized manner
Grant 7,439,168 - Boit , et al. October 21, 2 | 2008-10-21 |
Sub-resolution alignment of images
Grant 7,409,653 - Sengupta , et al. August 5, 2 | 2008-08-05 |
Apparatus and method for detecting photon emissions from transistors
Grant 7,400,154 - Desplats , et al. July 15, 2 | 2008-07-15 |
Methods And Systems Of Performing Device Failure Analysis, Electrical Characterization And Physical Characterization
App 20080142711 - Lundquist; Theodore R. | 2008-06-19 |
Apparatus And Method For Integrated Circuit Design For Circuit Edit
App 20080028345 - Suri; Hitesh ; et al. | 2008-01-31 |
Apparatus And Method For Optical Interference Fringe Based Integrated Circuit Processing
App 20070293052 - Le Roy; Erwan ; et al. | 2007-12-20 |
Apparatus and method for circuit operation definition
App 20060261043 - Betz; Martin ; et al. | 2006-11-23 |
Charged particle guide
Grant 7,135,678 - Wang , et al. November 14, 2 | 2006-11-14 |
Fib Milling Of Copper Over Organic Dielectrics
App 20060219949 - Makarov; Vladimir V. ; et al. | 2006-10-05 |
Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrate
Grant 7,115,426 - Le Roy , et al. October 3, 2 | 2006-10-03 |
Apparatus and method for optical interference fringe based integrated circuit processing
App 20060188797 - Roy; Erwan Le ; et al. | 2006-08-24 |
FIB milling of copper over organic dielectrics
Grant 7,060,196 - Makarov , et al. June 13, 2 | 2006-06-13 |
Imaging integrated circuits with focused ion beam
Grant 7,036,109 - Tsao , et al. April 25, 2 | 2006-04-25 |
Apparatus and method of forming silicide in a localized manner
App 20060079086 - Boit; Christian ; et al. | 2006-04-13 |
Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrate
App 20060030064 - Roy; Erwan Le ; et al. | 2006-02-09 |
Charged particle guide
App 20060006329 - Wang; Qinsong Steve ; et al. | 2006-01-12 |
Apparatus and method for detecting photon emissions from transistors
App 20050231219 - Desplats, Romain ; et al. | 2005-10-20 |
Apparatus and method for detecting photon emissions from transistors
Grant 6,943,572 - Desplats , et al. September 13, 2 | 2005-09-13 |
Precise, in-situ endpoint detection for charged particle beam processing
Grant 6,905,623 - Lundquist , et al. June 14, 2 | 2005-06-14 |
Precise, in-situ endpoint detection for charged particle beam processing
App 20050109956 - Lundquist, Theodore R. ; et al. | 2005-05-26 |
FIB milling of copper over organic dielectrics
App 20050072756 - Makarov, Vladimir V. ; et al. | 2005-04-07 |
Measuring back-side voltage of an integrated circuit
Grant 6,872,581 - Shaw , et al. March 29, 2 | 2005-03-29 |
Sub-resolution alignment of images
App 20050044519 - Sengupta, Madhumita ; et al. | 2005-02-24 |
Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localization
App 20050024057 - Desplats, Romain ; et al. | 2005-02-03 |
Sub-resolution alignment of images
Grant 6,848,087 - Sengupta , et al. January 25, 2 | 2005-01-25 |
Apparatus and method for detecting photon emissions from transistors
App 20040189335 - Desplats, Romain ; et al. | 2004-09-30 |
Method for surface preparation to enable uniform etching of polycrystalline materials
App 20040084408 - Makarov, Vladimir V. ; et al. | 2004-05-06 |
Method for surface preparation to enable uniform etching of polycrystalline materials
App 20040084407 - Makarov, Vladimir V. ; et al. | 2004-05-06 |
Method for backside die thinning and polishing of packaged integrated circuits
App 20040014401 - Tsao, Chun-Cheng ; et al. | 2004-01-22 |
Precise, in-situ endpoint detection for charged particle beam processing
App 20030132196 - Lundquist, Theodore R. ; et al. | 2003-07-17 |
Sub-resolution alignment of images
App 20020199164 - Sengupta, Madhumita ; et al. | 2002-12-26 |
Measuring back-side voltage of an integrated circuit
App 20020151091 - Shaw, Christopher ; et al. | 2002-10-17 |
Precise, in-situ endpoint detection for charged particle beam processing
App 20020074494 - Lundquist, Theodore R. ; et al. | 2002-06-20 |
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