Luiten; Otger Jan
Patent Applications and Registrations
Patent applications and USPTO patent grants for Luiten; Otger Jan.The latest application filed is for "tunable source of intense, narrowband, fully coherent, soft x-rays".
- Luiten; Otger Jan - Eindhoven NL
- Luiten; Otger Jan - Veldhoven NL
| Patent | Date |
|---|---|
| Tunable source of intense, narrowband, fully coherent, soft X-rays App 20210400796 - Luiten; Otger Jan ; et al. | 2021-12-23 |
| Radiation sensor apparatus Grant 10,900,829 - Banine , et al. January 26, 2 | 2021-01-26 |
| Lithographic method Grant 10,884,339 - Engelen , et al. January 5, 2 | 2021-01-05 |
| Electron beam generation for transmission electron microscope Grant 10,529,536 - Luiten J | 2020-01-07 |
| Radiation Sensor Apparatus App 20190353521 - Banine; Vadim Yevgenyevich ; et al. | 2019-11-21 |
| Lithographic Method App 20190302625 - ENGELEN; Wouter Joep ; et al. | 2019-10-03 |
| Electron Beam Generation for Transmission Electron Microscope App 20180301317 - Luiten; Otger Jan | 2018-10-18 |
| Time-of-flight charged particle spectroscopy Grant 9,984,852 - Luiten , et al. May 29, 2 | 2018-05-29 |
| Lithographic Method App 20180081278 - NIKIPELOV; Andrey Alexandrovich ; et al. | 2018-03-22 |
| Radiation Sensor Apparatus App 20180058928 - BANINE; Vadim Yevgenyevich ; et al. | 2018-03-01 |
| Lithographic method Grant 9,823,572 - Nikipelov , et al. November 21, 2 | 2017-11-21 |
| Lithographic Method App 20160147161 - NIKIPELOV; Andrey Alexandrovich ; et al. | 2016-05-26 |
| Beam pulsing device for use in charged-particle microscopy Grant 9,048,060 - Kieft , et al. June 2, 2 | 2015-06-02 |
| Beam Pulsing Device For Use In Charged-particle Microscopy App 20140103225 - Kieft; Erik Rene ; et al. | 2014-04-17 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 