Luecken; Uwe

Patent Applications and Registrations

Patent applications and USPTO patent grants for Luecken; Uwe.The latest application filed is for "method of investigating the wavefront of a charged-particle beam".

Company Profile

0.16.15

Luecken; Uwe - Eindhoven NL
Luecken; Uwe - Sudbrookmerland DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of investigating the wavefront of a charged-particle beam Grant 9,202,670 - Janssen , et al. December 1, 2	2015-12-01
Method for electron tomography Grant 9,147,551 - Luecken , et al. September 29, 2	2015-09-29
Method Of Investigating The Wavefront Of A Charged-particle Beam App 20150170876 - Janssen; Bart Jozef ; et al.	2015-06-18
Method for Electron Tomography App 20150069231 - Luecken; Uwe ; et al.	2015-03-12
Method of performing tomographic imaging of a sample in a charged-particle microscope Grant 8,912,491 - Schoenmakers , et al. December 16, 2	2014-12-16
Method for acquiring data with an image sensor Grant 8,817,148 - Janssen , et al. August 26, 2	2014-08-26
Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus Grant 8,757,873 - van den Boom , et al. June 24, 2	2014-06-24
Method Of Performing Tomographic Imaging Of A Sample In A Charged-particle Microscope App 20140145077 - Schoenmakers; Remco ; et al.	2014-05-29
Method of use for a multipole detector for a transmission electron microscope Grant 8,692,196 - Tiemeijer , et al. April 8, 2	2014-04-08
Method of Preparing a Biological Sample for Inspection with Electron Microscopy and Fluorescent Light Microscopy App 20130316365 - van Donselaar; Elly ; et al.	2013-11-28
Method of using a direct electron detector for a TEM Grant 8,592,762 - Luecken , et al. November 26, 2	2013-11-26
Distortion free stigmation of a TEM Grant 8,569,693 - Bischoff , et al. October 29, 2	2013-10-29
Method For Acquiring Data With An Image Sensor App 20130093931 - Janssen; Bart Jozef ; et al.	2013-04-18
Distortion Free Stigmation of a TEM App 20130062520 - Henstra; Alexander ; et al.	2013-03-14
Detector system for transmission electron microscope Grant 8,338,782 - Luecken , et al. December 25, 2	2012-12-25
Detector system for use with transmission electron microscope spectroscopy Grant 8,334,512 - Luecken , et al. December 18, 2	2012-12-18
Method of Measuring the Temperature of a Sample Carrier in a Charged Particle-Optical Apparatus App 20120128028 - van den Boom; Stephanus Hubertus Leonardus ; et al.	2012-05-24
Detector System for Transmission Electron Microscope App 20120049061 - Luecken; Uwe ; et al.	2012-03-01
Detector System for Use with Transmission Electron Microscope Spectroscopy App 20120049060 - Luecken; Uwe ; et al.	2012-03-01
Method of Using a Direct Electron Detector for a TEM App 20110266439 - Luecken; Uwe ; et al.	2011-11-03
Method for attaching a sample to a manipulator by melting and then freezing part of said sample Grant 7,845,245 - Hayles , et al. December 7, 2	2010-12-07
Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus Grant 7,825,378 - Yakushevska , et al. November 2, 2	2010-11-02
Method For Correcting Distortions In A Particle-optical Apparatus App 20100072366 - Tiemeijer; Peter Christiaan ; et al.	2010-03-25
Method For Obtaining A Scanning Transmission Image Of A Sample In A Particle-optical Apparatus App 20090133167 - Yakushevska; Alevtyna ; et al.	2009-05-21
Method For Attaching A Sample To A Manipulator App 20090000400 - Hayles; Michael Frederick ; et al.	2009-01-01

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