Lu; Yunjun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lu; Yunjun.The latest application filed is for "apparatus and method for detecting wavefront aberration of objective lens".

Company Profile

5.6.6

Lu; Yunjun - Shanghai CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus And Method For Detecting Wavefront Aberration Of Objective Lens App 20220299402 - Li; Peng ; et al.	2022-09-22
Method for high-accuracy wavefront measurement base on grating shearing interferometry Grant 11,340,118 - Lu , et al. May 24, 2	2022-05-24
Method For High-accuracy Wavefront Measurement Base On Grating Shearing Interferometry App 20220074793 - LU; Yunjun ; et al.	2022-03-10
Light intensity fluctuation-insensitive projection objective wave aberration detection device and detection method thereof Grant 11,215,512 - Tang , et al. January 4, 2	2022-01-04
Light Intensity Fluctuation-insensitive Projection Objective Wave Aberration Detection Device And Detection Method Thereof App 20210208005 - TANG; Feng ; et al.	2021-07-08
Device and method for detecting projection objective wave-front aberration Grant 11,029,611 - Tang , et al. June 8, 2	2021-06-08
Method for wavefront measurement of optical imaging system based on grating shearing interferometry Grant 11,009,336 - Lu , et al. May 18, 2	2021-05-18
Method for detecting wavefront aberration for optical imaging system based on grating shearing interferometer Grant 10,969,274 - Lu , et al. April 6, 2	2021-04-06
Device And Method For Detecting Projection Objective Wave-front Aberration App 20210026250 - Tang; Feng ; et al.	2021-01-28
Method For Detecting Wavefront Aberration For Optical Imaging System Based On Grating Shearing Interferometer App 20200292384 - LU; Yunjun ; et al.	2020-09-17
Method For Wavefront Measurement Of Optical Imaging System Based On Grating Shearing Interferometry App 20200292296 - LU; Yunjun ; et al.	2020-09-17
Device for measuring point diffraction interferometric wavefront aberration and method for detecting wave aberration Grant 9,658,114 - Tang , et al. May 23, 2	2017-05-23

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.