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name:-0.014760971069336
name:-0.0068259239196777
name:-0.0072810649871826
Lu; Meng-Kung Patent Filings

Lu; Meng-Kung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lu; Meng-Kung.The latest application filed is for "rotatable cushioning pick-and-place device".

Company Profile
4.6.10
  • Lu; Meng-Kung - Taoyuan TW
  • LU; Meng-Kung - Taoyuan City TW
  • Lu; Meng-Kung - Taoyuan County TW
  • Lu; Meng-Kung - Hwa-Ya Technology Park TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Rotatable cushioning pick-and-place device
Grant 11,400,605 - Chen , et al. August 2, 2
2022-08-02
Sliding test device for electronic components
Grant 11,333,704 - Ouyang , et al. May 17, 2
2022-05-17
Rotatable Cushioning Pick-and-place Device
App 20210197405 - CHEN; Chien-Ming ;   et al.
2021-07-01
Test apparatus for testing electronic device
Grant 10,948,518 - Chen , et al. March 16, 2
2021-03-16
Sliding test device for electronic components
App 20200081060 - Ouyang; Chin-Yi ;   et al.
2020-03-12
Test apparatus for testing electronic device
App 20190361047 - CHEN; Chien-Ming ;   et al.
2019-11-28
Device for pressing electronic component with different downward forces
Grant 10,488,459 - Wu , et al. Nov
2019-11-26
Device For Pressing Electronic Component With Different Downward Forces
App 20180292452 - WU; Chi-Chen ;   et al.
2018-10-11
Radiator module system for automatic test equipment
Grant 9,658,283 - Wu , et al. May 23, 2
2017-05-23
Test device for testing a PoP stacked-chip
Grant 9,347,989 - Chen , et al. May 24, 2
2016-05-24
Radiator Module System For Automatic Test Equipment
App 20150198659 - WU; XIN-YI ;   et al.
2015-07-16
Test Device For Testing A Pop Stacked-chip
App 20130293254 - CHEN; Chien-Ming ;   et al.
2013-11-07
Radiator Module System for Automatic Test Equipment
App 20130127483 - WU; Xin-Yi ;   et al.
2013-05-23
Temperature Control System for IC Tester
App 20130113509 - WU; Xin-Yi ;   et al.
2013-05-09

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