loadpatents
name:-0.008368968963623
name:-0.058209896087646
name:-0.0074999332427979
Lu; Hong-Qiang Patent Filings

Lu; Hong-Qiang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lu; Hong-Qiang.The latest application filed is for "dielectric barrier films for use as copper barrier layers in semiconductor trench and via structures".

Company Profile
0.9.5
  • Lu; Hong-Qiang - Fremont CA
  • Lu; Hong-Qiang - Gresham OR
  • Lu; Hong-Qiang - Lake Oswego OR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Methods and structure for forming copper barrier layers integral with semiconductor substrates structures
Grant 7,646,077 - Lu , et al. January 12, 2
2010-01-12
Dielectric Barrier Films For Use As Copper Barrier Layers In Semiconductor Trench And Via Structures
App 20080303155 - LU; Hong-Qiang ;   et al.
2008-12-11
Dielectric barrier films for use as copper barrier layers in semiconductor trench and via structures
Grant 7,427,563 - Lu , et al. September 23, 2
2008-09-23
Dual layer barrier film techniques to prevent resist poisoning
Grant 7,393,780 - Lu , et al. July 1, 2
2008-07-01
Dual layer barrier film techniques to prevent resist poisoning
App 20060205203 - Lu; Hong-Qiang ;   et al.
2006-09-14
Dual layer barrier film techniques to prevent resist poisoning
Grant 7,071,094 - Lu , et al. July 4, 2
2006-07-04
Carbon nanotube memory cell for integrated circuit structure with removable side spacers to permit access to memory cell and process for forming such memory cell
Grant 6,955,937 - Burke , et al. October 18, 2
2005-10-18
Dielectric barrier films for use as copper barrier layers in semiconductor trench and via structures
App 20050208758 - Lu, Hong-Qiang ;   et al.
2005-09-22
Dielectric barrier films for use as copper barrier layers in semiconductor trench and via structures
Grant 6,939,800 - Lu , et al. September 6, 2
2005-09-06
Dual layer barrier film techniques to prevent resist poisoning
App 20040253784 - Lu, Hong-Qiang ;   et al.
2004-12-16
Dual layer barrier film techniques to prevent resist poisoning
Grant 6,812,134 - Lu , et al. November 2, 2
2004-11-02
Method and structure for forming dielectric layers having reduced dielectric constants
Grant 6,774,057 - Lu , et al. August 10, 2
2004-08-10
Process for forming metal-filled openings in low dielectric constant dielectric material while inhibiting via poisoning
Grant 6,503,840 - Catabay , et al. January 7, 2
2003-01-07
Process for forming metal-filled openings in low dielectric constant dielectric material while inhibiting via poisoning
App 20020164877 - Catabay, Wilbur G. ;   et al.
2002-11-07

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed