Lowney; Donnacha

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lowney; Donnacha.The latest application filed is for "solder bump arrangements for large area analog circuitry".

Company Profile

0.9.7

Lowney; Donnacha - Dublin IE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Radio frequency current steering digital to analog converter Grant 9,432,036 - Lowney , et al. August 30, 2	2016-08-30
Solder bump arrangements for large area analog circuitry Grant 9,343,418 - Lowney , et al. May 17, 2	2016-05-17
System and method for reducing effects of switched capacitor kickback noise Grant 9,312,586 - Lowney , et al. April 12, 2	2016-04-12
Package integrity monitor with sacrificial bumps Grant 9,128,148 - Lowney , et al. September 8, 2	2015-09-08
Noise attenuation wall Grant 9,054,096 - Erdmann , et al. June 9, 2	2015-06-09
High-speed and high-resolution signal analysis system Grant 9,035,815 - Lowney , et al. May 19, 2	2015-05-19
Solder Bump Arrangements For Large Area Analog Circuitry App 20150123265 - Lowney; Donnacha ; et al.	2015-05-07
Current steering with independent biasing between bleed and steering circuitry Grant 9,000,812 - Lowney , et al. April 7, 2	2015-04-07
Calibration of a switching instant of a switch Grant 8,890,730 - Lowney , et al. November 18, 2	2014-11-18
Calibration Of A Switching Instant Of A Switch App 20140266824 - Lowney; Donnacha ; et al.	2014-09-18
Package Integrity Monitor With Sacrificial Bumps App 20140253171 - Lowney; Donnacha ; et al.	2014-09-11
System And Method For Reducing Effects Of Switched Capacitor Kickback Noise App 20140132369 - Lowney; Donnacha ; et al.	2014-05-15
Noise Attenuation Wall App 20140084477 - Erdmann; Christophe ; et al.	2014-03-27
Method and apparatus for analysis of semiconductor materials using photoacoustic spectroscopy techniques Grant 7,586,611 - Lowney , et al. September 8, 2	2009-09-08
Method and apparatus for analysis of semiconductor materials using photoacoustic spectroscopy techniques App 20060256339 - Lowney; Donnacha ; et al.	2006-11-16

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