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name:-0.0064718723297119
name:-0.00506591796875
name:-0.0025298595428467
Lou; Taisia Tsukruk Patent Filings

Lou; Taisia Tsukruk

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lou; Taisia Tsukruk.The latest application filed is for "system and method for quantifying x-ray backscatter system performance".

Company Profile
5.7.7
  • Lou; Taisia Tsukruk - Olivette MO
  • Lou; Taisia Tsukruk - St. Louis MO
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method and system for evaluating corrosion loss
Grant 10,937,006 - Engelbart , et al. March 2, 2
2021-03-02
Terahertz inspection for additively manufactured materials
Grant 10,773,458 - Lou , et al. Sept
2020-09-15
System and method for quantifying x-ray backscatter system performance
Grant 10,613,041 - Grimshaw , et al.
2020-04-07
System And Method For Quantifying X-ray Backscatter System Performance
App 20200003707 - Grimshaw; Matthew T. ;   et al.
2020-01-02
System and method for quantifying X-ray backscatter system performance
Grant 10,436,724 - Grimshaw , et al. O
2019-10-08
Terahertz Inspection for Additively Manufactured Materials
App 20190240908 - Lou; Taisia Tsukruk ;   et al.
2019-08-08
Method And System For Evaluating Corrosion Loss
App 20180357613 - Engelbart; Roger W. ;   et al.
2018-12-13
System and Method for Quantifying X-Ray Backscatter System Performance
App 20170227478 - Grimshaw; Matthew T. ;   et al.
2017-08-10
Detecting gaps between fasteners and openings
Grant 9,689,813 - Lou , et al. June 27, 2
2017-06-27
Method and system for non-destructively evaluating a hidden workpiece
Grant 9,506,879 - Engelbart , et al. November 29, 2
2016-11-29
Detecting Gaps Between Fasteners and Openings
App 20160252468 - Lou; Taisia Tsukruk ;   et al.
2016-09-01
System and method for quantifying X-ray backscatter system performance
Grant 9,398,676 - Grimshaw , et al. July 19, 2
2016-07-19
System and Method for Quantifying X-Ray Backscatter System Performance
App 20150319832 - Grimshaw; Matthew T. ;   et al.
2015-11-05
Method And System For Non-destructively Evaluating A Hidden Workpiece
App 20150055757 - Engelbart; Roger W. ;   et al.
2015-02-26

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