Loo; Sim Y.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Loo; Sim Y..The latest application filed is for "compact model for device/circuit/chip leakage current (iddq) calculation including process induced uplift factors".
- Loo; Sim Y. - Rochester MN
| Patent | Date |
|---|---|
| Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced uplift factors Grant 9,639,652 - Chang , et al. May 2, 2 | 2017-05-02 |
| Compact Model For Device/circuit/chip Leakage Current (iddq) Calculation Including Process Induced Uplift Factors App 20140123097 - Chang; Paul ; et al. | 2014-05-01 |
| Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced uplift factors Grant 8,626,480 - Chang , et al. January 7, 2 | 2014-01-07 |
| Efficient methodology for the accurate generation of customized compact model parameters from electrical test data Grant 8,032,349 - Loo , et al. October 4, 2 | 2011-10-04 |
| Compact Model For Device/circuit/chip Leakage Current (iddq) Calculation Including Process Induced Uplift Factors App 20110082680 - Chang; Paul ; et al. | 2011-04-07 |
| Efficient Methodology For The Accurate Generation Of Customized Compact Model Parameters From Electrical Test Data App 20080183442 - Loo; Sim Y. ; et al. | 2008-07-31 |
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