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name:-0.0040068626403809
name:-0.0015408992767334
name:-0.0005037784576416
Long; Dengwu Patent Filings

Long; Dengwu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Long; Dengwu.The latest application filed is for "backlight source flatness detection system and backlight source flatness detection method".

Company Profile
0.1.2
  • Long; Dengwu - Beijing CN
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

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