loadpatents
name:-0.006633996963501
name:-0.0028998851776123
name:-0.00057291984558105
Lomtscher; Patrick Patent Filings

Lomtscher; Patrick

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lomtscher; Patrick.The latest application filed is for "wafer exposure method using wafer models and wafer fabrication assembly".

Company Profile
0.2.6
  • Lomtscher; Patrick - Dresden DE
  • Lomtscher; Patrick - Tiefenbach OT Marbach DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Wafer exposure method using wafer models and wafer fabrication assembly
Grant 11,092,901 - Buhl , et al. August 17, 2
2021-08-17
Wafer Exposure Method Using Wafer Models and Wafer Fabrication Assembly
App 20210191272 - Buhl; Stefan ;   et al.
2021-06-24
Methods and Apparatus of Manufacturing a Semiconductor Device
App 20090168034 - Staecker; Jens ;   et al.
2009-07-02
Optimizing light path uniformity in inspection systems
Grant 7,248,351 - Roberts , et al. July 24, 2
2007-07-24
Optimizing focal plane fitting functions for an image field on a substrate
App 20060192943 - Roberts; William ;   et al.
2006-08-31
Optimizing light path uniformity in inspection systems
App 20060192947 - Roberts; William ;   et al.
2006-08-31
System for analyzing images of blazed phase grating samples
App 20060193531 - Roberts; William ;   et al.
2006-08-31
Run to run control for lens aberrations
App 20060194130 - Roberts; William ;   et al.
2006-08-31

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