| Patent | Date |
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Method of Manufacturing Semiconductor Devices with Multiple Silicide Regions
App 20220293474 - Loh; Wei-Yip ; et al. | 2022-09-15 |
Contact Structure For Semiconductor Device And Method
App 20220278199 - Tsai; Yan-Ming ; et al. | 2022-09-01 |
Barrier-Free Approach for Forming Contact Plugs
App 20220277997 - Chen; Ching-Yi ; et al. | 2022-09-01 |
Contact with a silicide region
Grant 11,411,094 - Cheng , et al. August 9, 2 | 2022-08-09 |
Semiconductor device pre-cleaning
Grant 11,373,905 - Chu , et al. June 28, 2 | 2022-06-28 |
Method of manufacturing semiconductor devices with multiple silicide regions
Grant 11,348,839 - Loh , et al. May 31, 2 | 2022-05-31 |
Barrier-free approach for forming contact plugs
Grant 11,342,225 - Chen , et al. May 24, 2 | 2022-05-24 |
Contact structure for semiconductor device and method
Grant 11,335,774 - Tsai , et al. May 17, 2 | 2022-05-17 |
Ammonium Fluoride Pre-clean Protection
App 20220149519 - CHU; Li-Wei ; et al. | 2022-05-12 |
Semiconductor Device Pre-cleaning
App 20220068712 - CHU; Li-Wei ; et al. | 2022-03-03 |
Ammonium fluoride pre-clean protection
Grant 11,232,947 - Chu , et al. January 25, 2 | 2022-01-25 |
Deposition Window Enlargement
App 20210407808 - Chou; Meng-Han ; et al. | 2021-12-30 |
Method for forming semiconductor contact structure
Grant 11,195,791 - Cheng , et al. December 7, 2 | 2021-12-07 |
Semiconductor structure
Grant 11,177,172 - Tsai , et al. November 16, 2 | 2021-11-16 |
Conductive Feature Formation and Structure
App 20210296168 - Loh; Wei-Yip ; et al. | 2021-09-23 |
Conductive feature formation and structure
Grant 11,031,286 - Loh , et al. June 8, 2 | 2021-06-08 |
Contact Structure For Semiconductor Device And Method
App 20210118994 - Tsai; Yan-Ming ; et al. | 2021-04-22 |
Semiconductor Device and Method of Manufacturing
App 20210035868 - Loh; Wei-Yip ; et al. | 2021-02-04 |
Barrier-Free Approach For Forming Contact Plugs
App 20210035861 - Chen; Ching-Yi ; et al. | 2021-02-04 |
Treatment for Adhesion Improvement
App 20200388485 - Chen; Ching-Yi ; et al. | 2020-12-10 |
Treatment for adhesion improvement
Grant 10,755,917 - Chen , et al. A | 2020-08-25 |
Method of Forming a Contact with a Silicide Region
App 20200152763 - Cheng; Yu-Wen ; et al. | 2020-05-14 |
Method For Forming Semiconductor Contact Structure
App 20200111739 - CHENG; Yu-Wen ; et al. | 2020-04-09 |
Semiconductor Structure
App 20200083100 - TSAI; YAN-MING ; et al. | 2020-03-12 |
Method of forming a contact with a silicide region
Grant 10,535,748 - Cheng , et al. Ja | 2020-01-14 |
Treatment for Adhesion Improvement
App 20200006055 - Chen; Ching-Yi ; et al. | 2020-01-02 |
Contact structure and the method of forming the same
Grant 10,504,834 - Cheng , et al. Dec | 2019-12-10 |
Semiconductor structure and method for manufacturing the same
Grant 10,483,164 - Tsai , et al. Nov | 2019-11-19 |
Conductive Feature Formation and Structure
App 20190273023 - LOH; Wei-Yip ; et al. | 2019-09-05 |
Conformal Metal Diffusion Barrier And Plasma Treatment For Oxidized Metal Barrier
App 20190273147 - CHENG; Yu-Wen ; et al. | 2019-09-05 |
Contact Structure And The Method Of Forming The Same
App 20190273042 - Cheng; Yu-Wen ; et al. | 2019-09-05 |
Semiconductor Structure And Method For Manufacturing The Same
App 20190148230 - TSAI; YAN-MING ; et al. | 2019-05-16 |
N-type Iii-v Semiconductor Structures Having Ultra-shallow Junctions And Methods Of Forming Same
App 20150333128 - LEE; Rinus ; et al. | 2015-11-19 |
Tunneling field-effect transistor with direct tunneling for enhanced tunneling current
Grant 9,029,218 - Loh , et al. May 12, 2 | 2015-05-12 |
Sulfur And Selenium Passivation Of Semiconductors
App 20150118834 - LOH; Wei-Yip ; et al. | 2015-04-30 |
Phosphorus And Arsenic Doping Of Semiconductor Materials
App 20150111372 - TIECKELMANN; Robert ; et al. | 2015-04-23 |
Gated Circuit Structure With Ultra-thin, Epitaxially-grown Tunnel And Channel Layer
App 20140054549 - LOH; Wei-Yip ; et al. | 2014-02-27 |
Gated Circuit Structure With Self-aligned Tunneling Region
App 20130320427 - LOH; Wei-Yip ; et al. | 2013-12-05 |
Tunneling Field-effect Transistor With Direct Tunneling For Enhanced Tunneling Current
App 20130230954 - Loh; Wei-Yip ; et al. | 2013-09-05 |
Tunneling field-effect transistor with direct tunneling for enhanced tunneling current
Grant 8,436,422 - Loh , et al. May 7, 2 | 2013-05-07 |
Apparatus, system, and method for tunneling MOSFETs using self-aligned heterostructure source and isolated drain
Grant 8,421,165 - Loh , et al. April 16, 2 | 2013-04-16 |
Electro-optic device with novel insulating structure and a method for manufacturing the same
Grant 8,362,494 - Lo , et al. January 29, 2 | 2013-01-29 |
Interfacial barrier for work function modification of high performance CMOS devices
Grant 8,178,939 - Loh , et al. May 15, 2 | 2012-05-15 |
Apparatus, System, and Method for Tunneling Mosfets Using Self-Aligned Heterostructure Source and Isolated Drain
App 20110278670 - LOH; WEI-YIP ; et al. | 2011-11-17 |
Tunneling Field-effect Transistor With Direct Tunneling For Enhanced Tunneling Current
App 20110215425 - Loh; Wei-Yip ; et al. | 2011-09-08 |
Electro-optic Device And A Method For Manufacturing The Same
App 20110180795 - Lo; Guo-Qiang Patrick ; et al. | 2011-07-28 |
Interfacial Barrier for Work Function Modification of High Performance CMOS Devices
App 20100320510 - Loh; Wei-Yip ; et al. | 2010-12-23 |
Fully salicided (FUCA) MOSFET structure
Grant 7,682,914 - Lo , et al. March 23, 2 | 2010-03-23 |
Method For Straining A Semiconductor Wafer And A Wafer Substrate Unit Used Therein
App 20100052064 - Lo; Guo-Qiang ; et al. | 2010-03-04 |
Method of fabricating tensile strained layers and compressive strain layers for a CMOS device
Grant 7,439,165 - Lo , et al. October 21, 2 | 2008-10-21 |
Fully salicided (FUCA) MOSFET structure
App 20080064153 - Qiang Lo; Patrick Guo ; et al. | 2008-03-13 |
Fully salicided (FUSA) MOSFET structure
Grant 7,294,890 - Lo , et al. November 13, 2 | 2007-11-13 |
Method of fabricating strained channel devices
App 20060226483 - Lo; Patrick Guo Oiang ; et al. | 2006-10-12 |
Fully salicided (FUSA) MOSFET structure
App 20060199321 - Lo; Patrick Guo Qiang ; et al. | 2006-09-07 |
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