Loh; Wah Kit

Patent Applications and Registrations

Patent applications and USPTO patent grants for Loh; Wah Kit.The latest application filed is for "array power supply-based screening of static random access memory cells for bias temperature instability".

Company Profile

0.49.42

Loh; Wah Kit - Richardson TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Array power supply-based screening of static random access memory cells for bias temperature instability Grant 11,355,182 - Deng , et al. June 7, 2	2022-06-07
Array Power Supply-Based Screening of Static Random Access Memory Cells for Bias Temperature Instability App 20180068713 - Deng; Xiaowei ; et al.	2018-03-08
Array power supply-based screening of static random access memory cells for bias temperature instability Grant 9,805,788 - Deng , et al. October 31, 2	2017-10-31
Array power supply-based screening of static random access memory cells for bias temperature instability Grant 9,576,643 - Deng , et al. February 21, 2	2017-02-21
Read-current and word line delay path tracking for sense amplifier enable timing Grant 9,576,621 - Seshadri , et al. February 21, 2	2017-02-21
SRAM with buffered-read bit cells and its testing Grant 9,472,268 - Deng , et al. October 18, 2	2016-10-18
Array power supply-based screening of static random access memory cells for bias temperature instability Grant 9,466,356 - Deng , et al. October 11, 2	2016-10-11
Array power supply-based screening of static random access memory cells for bias temperature instability Grant 9,455,021 - Deng , et al. September 27, 2	2016-09-27
SRAM with buffered-read bit cells and its testing Grant 9,412,437 - Deng , et al. August 9, 2	2016-08-09
Functional screening of static random access memories using an array bias voltage Grant 9,208,832 - Deng , et al. December 8, 2	2015-12-08
Bitline leakage detection in memories Grant 9,208,902 - Pious , et al. December 8, 2	2015-12-08
Array Power Supply-Based Screening of Static Random Access Memory Cells for Bias Temperature Instability App 20150348615 - Deng; Xiaowei ; et al.	2015-12-03
Array Power Supply-Based Screening of Static Random Access Memory Cells for Bias Temperature Instability App 20150340084 - Deng; Xiaowei ; et al.	2015-11-26
Array Power Supply-Based Screening of Static Random Access Memory Cells for Bias Temperature Instability App 20150340081 - Deng; Xiaowei ; et al.	2015-11-26
CMOS process to improve SRAM yield Grant 9,093,315 - Yu , et al. July 28, 2	2015-07-28
Method of screening static random access memory cells for positive bias temperature instability Grant 8,971,138 - Seshadri , et al. March 3, 2	2015-03-03
CMOS Process To Improve SRAM Yield App 20140346609 - Yu; Shaofeng ; et al.	2014-11-27
SRAM power reduction through selective programming Grant 8,755,237 - Loh June 17, 2	2014-06-17
Sram With Buffered-read Bit Cells And Its Testing App 20140126277 - Deng; Xiaowei ; et al.	2014-05-08
Static random-access memory cell array with deep well regions Grant 8,716,808 - Deng , et al. May 6, 2	2014-05-06
Static Random Access Memory Cell With Single-sided Buffer And Asymmetric Construction App 20140078819 - Deng; Xiaowei ; et al.	2014-03-20
Static random access memory cell with single-sided buffer and asymmetric construction Grant 8,654,562 - Deng , et al. February 18, 2	2014-02-18
Read-Current and Word Line Delay Path Tracking for Sense Amplifier Enable Timing App 20140010032 - Seshadri; Anand ; et al.	2014-01-09
Sram With Buffered-read Bit Cells And Its Testing App 20130343136 - Deng; Xiaowei ; et al.	2013-12-26
CMOS process to improve SRAM yield Grant 8,603,875 - Yu , et al. December 10, 2	2013-12-10
Static Random-Access Memory Cell Array with Deep Well Regions App 20130320458 - Deng; Xiaowei ; et al.	2013-12-05
Low power retention random access memory with error correction on wake-up Grant 8,560,931 - Seshadri , et al. October 15, 2	2013-10-15
Repairing soft failures in memory cells in SRAM arrays Grant 8,542,545 - Loh , et al. September 24, 2	2013-09-24
Method of screening static random access memories for pass transistor defects Grant 8,526,253 - Pious , et al. September 3, 2	2013-09-03
Static Random Access Memory Cell with Single-Sided Buffer and Asymmetric Construction App 20130182490 - Deng; Xiaowei ; et al.	2013-07-18
Electrical Screening of Static Random Access Memories at Varying Locations in a Large-Scale Integrated Circuit App 20130176772 - Deng; Xiaowei ; et al.	2013-07-11
Array-based integrated circuit with reduced proximity effects Grant 8,472,229 - Deng , et al. June 25, 2	2013-06-25
Array-based integrated circuit with reduced proximity effects Grant 8,472,228 - Deng , et al. June 25, 2	2013-06-25
Asymmetric static random access memory cell with dual stress liner Grant 8,467,233 - Yu , et al. June 18, 2	2013-06-18
Method of screening static random access memories for unstable memory cells Grant 8,432,760 - Deng , et al. April 30, 2	2013-04-30
Sram Power Reduction Through Selective Programming App 20130094314 - Loh; Wah Kit	2013-04-18
Method of Screening Static Random Access Memory Cells for Positive Bias Temperature Instability App 20130058177 - Seshadri; Anand ; et al.	2013-03-07
Method of Screening Static Random Access Memories for Pass Transistor Defects App 20130051169 - Pious; Beena ; et al.	2013-02-28
Array-based Integrated Circuit With Reduced Proximity Effects App 20130044536 - Deng; Xiaowei ; et al.	2013-02-21
Structure and methods for measuring margins in an SRAM bit Grant 8,379,467 - Deng , et al. February 19, 2	2013-02-19
Method of Screening Static Random Access Memories for Unstable Memory Cells App 20130028036 - Deng; Xiaowei ; et al.	2013-01-31
Array Power Supply-Based Screening of Static Random Access Memory Cells for Bias Temperature Instability App 20130021864 - Deng; Xiaowei ; et al.	2013-01-24
Low Power Retention Random Access Memory with Error Correction on Wake-Up App 20120324314 - Seshadri; Anand ; et al.	2012-12-20
Asymmetric Static Random Access Memory Cell with Dual Stress Liner App 20120307550 - Yu; Shaofeng ; et al.	2012-12-06
Repairing Soft Failures in Memory Cells in SRAM Arrays App 20120243354 - Loh; Wah Kit ; et al.	2012-09-27
Method and structure for SRAM cell trip voltage measurement Grant 8,233,341 - Deng , et al. July 31, 2	2012-07-31
Margin testing of static random access memory cells Grant 8,228,749 - Deng , et al. July 24, 2	2012-07-24
Method and structure for SRAM Vmin/Vmax measurement Grant 8,174,914 - Deng , et al. May 8, 2	2012-05-08
Array-Based Integrated Circuit with Reduced Proximity Effects App 20120106225 - Deng; Xiaowei ; et al.	2012-05-03
Cmos Process To Improve Sram Yield App 20120104510 - Yu; Shaofeng ; et al.	2012-05-03
Structure and methods for measuring margins in an SRAM bit Grant 8,139,431 - Deng , et al. March 20, 2	2012-03-20
SRAM with buffered-read bit cells and its testing App 20120014195 - Deng; Xiaowei ; et al.	2012-01-19
Margin Testing of Static Random Access Memory Cells App 20110299349 - Deng; Xiaowei ; et al.	2011-12-08
Structure and Methods for Measuring Margins in an SRAM Bit App 20110158018 - Deng; Xiaowei ; et al.	2011-06-30
Method For Memory Cell Characterization Using Universal Structure App 20110158017 - Deng; Xiaowei ; et al.	2011-06-30
Method for memory cell characterization using universal structure Grant 7,924,640 - Deng , et al. April 12, 2	2011-04-12
Method and structure for SRAM VMIN/VMAX measurement App 20110051539 - Deng; Xiaowei ; et al.	2011-03-03
Method and structure for SRAM cell trip voltage measurement App 20110051540 - Deng; Xiaowei ; et al.	2011-03-03
Method for constructing Shmoo plots for SRAMs Grant 7,821,816 - Deng , et al. October 26, 2	2010-10-26
Method for Constructing Shmoo Plots for SRAMS App 20100232242 - Deng; Xiaowei ; et al.	2010-09-16
Structure and Methods for Measuring Margins in an SRAM bit App 20100208536 - Deng; Xiaowei ; et al.	2010-08-19
Bitline Leakage Detection in Memories App 20100110807 - Pious; Beena ; et al.	2010-05-06
Method For Memory Cell Characterization Using Universal Structure App 20080148116 - Deng; Xiaowei ; et al.	2008-06-19
SRAM static noise margin test structure suitable for on chip parametric measurements Grant 7,385,864 - Loh , et al. June 10, 2	2008-06-10
SRAM static noise margin test structure suitable for on chip parametric measurements App 20080062746 - Loh; Wah Kit ; et al.	2008-03-13
Method for determining and classifying SRAM bit fail modes suitable for production test implementation and real time feedback Grant 7,324,391 - Loh , et al. January 29, 2	2008-01-29
Method for reducing SRAM test time by applying power-up state knowledge Grant 7,216,272 - Loh May 8, 2	2007-05-08
Method for determining and classifying SRAM bit fail modes suitable for production test implementation and real time feedback App 20060227634 - Loh; Wah Kit ; et al.	2006-10-12
Method for reducing SRAM test time by applying power-up state knowledge App 20060190778 - Loh; Wah Kit	2006-08-24
On-chip temperature sensor and oscillator for reduced self-refresh current for dynamic random access memory Grant 6,281,760 - Koelling , et al. August 28, 2	2001-08-28
Memory regulator control method with flexibility for a wide change in supply voltage Grant 5,844,853 - Kitsukawa , et al. December 1, 1	1998-12-01

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