Loevsky; Barry

Patent Applications and Registrations

Patent applications and USPTO patent grants for Loevsky; Barry.The latest application filed is for "pupil tracking in an image display system".

Company Profile

7.10.7

Loevsky; Barry - Milpitas CA
Loevsky; Barry - Yokneam Ilit IL
Loevsky; Barry - Yokneam Illit IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Polarization measurements of metrology targets and corresponding target designs Grant 11,060,845 - Amit , et al. July 13, 2	2021-07-13
Zero order blocking and diverging for holographic imaging Grant 10,877,437 - Gelman , et al. December 29, 2	2020-12-29
Pupil Tracking In An Image Display System App 20200184865 - LOEVSKY; Barry ; et al.	2020-06-11
Polarization Measurements Of Metrology Targets And Corresponding Target Designs App 20200158492 - Amit; Eran ; et al.	2020-05-21
Polarization measurements of metrology targets and corresponding target designs Grant 10,458,777 - Amit , et al. Oc	2019-10-29
Focusing modules and methods Grant 10,352,766 - Loevsky , et al. July 16, 2	2019-07-16
Scatterometry system and method for generating non-overlapping and non-truncated diffraction images Grant 10,209,183 - Grunzweig , et al. Feb	2019-02-19
Metrology imaging targets having reflection-symmetric pairs of reflection-asymmetric structures Grant 10,190,979 - Manassen , et al. Ja	2019-01-29
Zero Order Blocking And Diverging For Holographic Imaging App 20190004478 - GELMAN; Shaul Alexander ; et al.	2019-01-03
Scatterometry System and Method for Generating Non-Overlapping and Non-Truncated Diffraction Images App 20180003630 - Grunzweig; Tzahi ; et al.	2018-01-04
Scatterometry system and method for generating non-overlapping and non-truncated diffraction images Grant 9,719,920 - Grunzweig , et al. August 1, 2	2017-08-01
Polarization Measurements Of Metrology Targets And Corresponding Target Designs App 20160178351 - AMIT; Eran ; et al.	2016-06-23
Metrology Imaging Targets Having Reflection-symmetric Pairs Of Reflection-asymmetric Structures App 20160084758 - Manassen; Amnon ; et al.	2016-03-24
Measurement of critical dimension and scanner aberration utilizing metrology targets Grant 9,255,787 - Manassen , et al. February 9, 2	2016-02-09
Overlay measurement based on moire effect between structured illumination and overlay target Grant 9,182,219 - Manassen , et al. November 10, 2	2015-11-10
Fit-to-pitch overlay measurement targets Grant 9,123,649 - Manassen , et al. September 1, 2	2015-09-01
Illumination Configurations For Scatterometry Measurements App 20150022822 - Grunzweig; Tzahi ; et al.	2015-01-22

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