loadpatents
name:-0.028976917266846
name:-0.036780834197998
name:-0.040782928466797
Lo; Hsien-Ching Patent Filings

Lo; Hsien-Ching

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lo; Hsien-Ching.The latest application filed is for "single diffusion break device for fdsoi".

Company Profile
31.35.27
  • Lo; Hsien-Ching - Clifton Park NY
  • Lo; Hsien-Ching - Round Rock TX
  • Lo; Hsien-Ching - Guilderland NY
  • Lo; Hsien-Ching - Taoyuan N/A TW
  • LO; Hsien-Ching - Taoyuan City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Single diffusion break device for FDSOI
Grant 10,957,578 - Hong , et al. March 23, 2
2021-03-23
Etch stop layer for use in forming contacts that extend to multiple depths
Grant 10,714,577 - Hong , et al.
2020-07-14
FinFET device with a wrap-around silicide source/drain contact structure
Grant 10,700,173 - Qi , et al.
2020-06-30
Fin-type transistors with spacers on the gates
Grant 10,636,894 - Shen , et al.
2020-04-28
Etch Stop Layer For Use In Forming Contacts That Extend To Multiple Depths
App 20200105886 - Hong; Wei ;   et al.
2020-04-02
Single Diffusion Break Device For Fdsoi
App 20200105584 - HONG; Wei ;   et al.
2020-04-02
Finfets Having Gates Parallel To Fins
App 20200066883 - Shen; Yanping ;   et al.
2020-02-27
Wrap-all-around contact for nanosheet-FET and method of forming same
Grant 10,559,656 - Bourjot , et al. Feb
2020-02-11
Field-effect Transistors With Improved Dielectric Gap Fill
App 20200043779 - Hong; Wei ;   et al.
2020-02-06
FinFETs having gates parallel to fins
Grant 10,553,707 - Shen , et al. Fe
2020-02-04
Field-effect transistors with improved dielectric gap fill
Grant 10,546,775 - Hong , et al. Ja
2020-01-28
Composite Spacers For Tailoring The Shape Of The Source And Drain Regions Of A Field-effect Transistor
App 20200020770 - Qi; Yi ;   et al.
2020-01-16
Wrap-all-around Contact For Nanosheet-fet And Method Of Forming Same
App 20190341448 - Bourjot; Emilie M.S. ;   et al.
2019-11-07
Epitaxial region for embedded source/drain region having uniform thickness
Grant 10,461,155 - Yong , et al. Oc
2019-10-29
Finfet Device With A Wrap-around Silicide Source/drain Contact Structure
App 20190312117 - Qi; Yi ;   et al.
2019-10-10
Multiple-layer spacers for field-effect transistors
Grant 10,431,665 - Han , et al. O
2019-10-01
Fin-type Transistors With Spacers On The Gates
App 20190280105 - Shen; Yanping ;   et al.
2019-09-12
Multiple gate length device with self-aligned top junction
Grant 10,410,929 - Zang , et al. Sept
2019-09-10
Intergrated circuit structure including single diffusion break abutting end isolation region, and methods of forming same
Grant 10,388,652 - Shi , et al. A
2019-08-20
Single-curvature cavity for semiconductor epitaxy
Grant 10,355,104 - Qi , et al. July 16, 2
2019-07-16
Multiple Gate Length Device With Self-aligned Top Junction
App 20190206743 - ZANG; Hui ;   et al.
2019-07-04
Dual-curvature Cavity For Epitaxial Semiconductor Growth
App 20190181243 - Vinslava; Alina ;   et al.
2019-06-13
Dual-curvature cavity for epitaxial semiconductor growth
Grant 10,297,675 - Vinslava , et al.
2019-05-21
Epitaxial Region For Embedded Source/drain Region Having Uniform Thickness
App 20190148492 - Yong; Yoong Hooi ;   et al.
2019-05-16
Integrated Circuit Structure Including Single Diffusion Break Abutting End Isolation Region, And Methods Of Forming Same
App 20190148373 - Shi; Yongiun ;   et al.
2019-05-16
Dual-curvature Cavity For Epitaxial Semiconductor Growth
App 20190131433 - Vinslava; Alina ;   et al.
2019-05-02
Single-curvature Cavity For Semiconductor Epitaxy
App 20190131432 - Qi; Yi ;   et al.
2019-05-02
Method of forming a vertical field effect transistor (VFET) and a VFET structure
Grant 10,276,689 - Qi , et al.
2019-04-30
Boundary spacer structure and integration
Grant 10,262,903 - Holt , et al.
2019-04-16
Method Of Forming Vertical Field Effect Transistors With Different Gate Lengths And A Resulting Structure
App 20190103319 - Qi; Yi ;   et al.
2019-04-04
Method of forming vertical field effect transistors with different gate lengths and a resulting structure
Grant 10,249,538 - Qi , et al.
2019-04-02
Vertical-transport field-effect transistors with an etched-through source/drain cavity
Grant 10,211,317 - Qi , et al. Feb
2019-02-19
Vertical-transport Field-effect Transistors With An Etched-through Source/drain Cavity
App 20190051735 - Qi; Yi ;   et al.
2019-02-14
Boundary Spacer Structure And Integration
App 20180374759 - HOLT; Judson R. ;   et al.
2018-12-27
Finfet diffusion break having protective liner in fin insulator
Grant 10,164,010 - Hong , et al. Dec
2018-12-25
Asymmetric spacer for preventing epitaxial merge between adjacent devices of a semiconductor and related method
Grant 10,163,635 - Qi , et al. Dec
2018-12-25
Method Of Forming A Vertical Field Effect Transistor (vfet) And A Vfet Structure
App 20180358452 - QI; YI ;   et al.
2018-12-13
Methods Of Forming Epi Semiconductor Material On A Thinned Fin In The Source/drain Regions Of A Finfet Device
App 20180323269 - Qi; Yi ;   et al.
2018-11-08
Methods of forming epi semiconductor material on a thinned fin in the source/drain regions of a FinFET device
Grant 10,121,868 - Qi , et al. November 6, 2
2018-11-06
Integrated circuit structure incorporating non-planar field effect transistors with different channel region heights and method
Grant 10,068,902 - Shen , et al. September 4, 2
2018-09-04
Multiple Fin heights with dielectric isolation
Grant 10,068,810 - Wu , et al. September 4, 2
2018-09-04
Vertical-transport field-effect transistors with an etched-through source/drain cavity
Grant 10,050,125 - Qi , et al. August 14, 2
2018-08-14
Method Of Forming Semiconductor Structure And Resulting Structure
App 20180190792 - Peng; Jianwei ;   et al.
2018-07-05
Multiple-layer Spacers For Field-effect Transistors
App 20180151690 - Han; Tao ;   et al.
2018-05-31
Multiple-layer spacers for field-effect transistors
Grant 9,947,769 - Han , et al. April 17, 2
2018-04-17
Methods of forming EPI semiconductor material on the source/drain regions of a FinFET device
Grant 9,887,094 - Qi , et al. February 6, 2
2018-02-06
Semiconductor device and method of manufacturing the same
Grant 9,847,225 - Cheng , et al. December 19, 2
2017-12-19
Multi-layer spacer used in finFET
Grant 9,419,101 - Peng , et al. August 16, 2
2016-08-16
Gate structure having lightly doped region
Grant 8,952,459 - Hing , et al. February 10, 2
2015-02-10
Gate Structure Having Lightly Doped Region
App 20130334617 - HING; Fung Ka ;   et al.
2013-12-19
Method for fabricating a gate structure
Grant 8,535,998 - Hing , et al. September 17, 2
2013-09-17
Self-aligned two-step STI formation through dummy poly removal
Grant 8,502,316 - Fung , et al. August 6, 2
2013-08-06
Semiconductor Device And Method Of Manufacturing The Same
App 20130119444 - CHENG; Chun-Fai ;   et al.
2013-05-16
Strained semiconductor device with recessed channel
Grant 8,368,147 - Cheng , et al. February 5, 2
2013-02-05
Strained Semiconductor Device with Recessed Channel
App 20110254105 - Cheng; Chun-Fai ;   et al.
2011-10-20
Method For Fabricating A Gate Structure
App 20110223752 - HING; Fung Ka ;   et al.
2011-09-15
Self-Aligned Two-Step STI Formation Through Dummy Poly Removal
App 20110193167 - Fung; Ka-Hing ;   et al.
2011-08-11

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed