Lo Chiwoei Wayne
USPTO Trademark & Patent Filings
Trademark applications and grants for Lo Chiwoei Wayne. Lo Chiwoei Wayne has 1 trademark applications. The latest application filed is for "GENIE INSIDE"
- Company Aliases
- Lo, Chiwoei Wayne
- wayne chiwoei lo
- Lo; Chiwoei Wayne - Campbell CA
- Lo, Chiwoei Wayne - Campbell CA
Trademarks Patents
| Patent Application | Date |
|---|---|
| Method and apparatus for multiple charged particle beams 20060108531 - 10/825696 Lo; Chiwoei Wayne ; et al. | 2006-05-25 |
| Method and apparatus for multiple charged particle beams 20050230633 - 10/826018 Lo, Chiwoei Wayne ; et al. | 2005-10-20 |
| Detection of defects in patterned substrates 20050200841 - 11/069491 Talbot, Christopher G. ; et al. | 2005-09-15 |
| Detection of defects in patterned substrates 20020166964 - 10/134210 Talbot, Christopher G. ; et al. | 2002-11-14 |
| Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam 20020149381 - 10/033845 Lo, Chiwoei Wayne ; et al. | 2002-10-17 |
| Method and apparatus for multiple charged particle beams 7,262,418 - 10/825,696 Lo , et al. August 28, 2 | 2007-08-28 |
| Detection of defects in patterned substrates 7,253,645 - 11/069,491 Talbot , et al. August 7, 2 | 2007-08-07 |
| Method and apparatus for multiple charged particle beams 7,067,809 - 10/826,018 Lo , et al. June 27, 2 | 2006-06-27 |
| Detection of defects in patterned substrates 6,914,441 - 10/134,210 Talbot , et al. July 5, 2 | 2005-07-05 |
| Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam 6,566,897 - 10/033,845 Lo , et al. May 20, 2 | 2003-05-20 |
Mark Image Registration | Serial | Trademark Application Date |
|---|---|
"GENIE INSIDE" 78365936 |
GENIE INSIDE 2004-02-11 |
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