LIU; Xinran

Patent Applications and Registrations

Patent applications and USPTO patent grants for LIU; Xinran.The latest application filed is for "method for obtaining parameters of semiconductor structure, method for obtaining detection standard and detection method".

Company Profile

0.2.6

LIU; Xinran - Hefei CN
LIU; Xinran - Hefei City CN
Liu; Xinran - Irving TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Obtaining Parameters Of Semiconductor Structure, Method For Obtaining Detection Standard And Detection Method App 20220238393 - LIU; Xinran ; et al.	2022-07-28
Method And Device For Predicting Inclination Angle, And Method And Device For Monitoring Etching Device App 20220223479 - SHAO; Bo ; et al.	2022-07-14
Process Monitoring Method And Process Monitoring System App 20220199474 - Wang; Chunyang ; et al.	2022-06-23
Semiconductor Device And Method For Manufacturing The Same App 20220085021 - LIU; Xinran ; et al.	2022-03-17
Methods for modulating transcriptional activation using mint proteins Grant 7,422,856 - Sudhof , et al. September 9, 2	2008-09-09
Methods for modulating transcriptional activation using mint proteins App 20070037188 - Sudhof; Thomas C. ; et al.	2007-02-15
Methods for modulating transcriptional activation using mint proteins Grant 7,081,337 - Sudhof , et al. July 25, 2	2006-07-25
Methods for modulating transcriptional activation using mint proteins App 20030036169 - Sudhof, Thomas C. ; et al.	2003-02-20

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.