Liu, Shuhong

USPTO Trademark & Patent Filings

Trademark applications and grants for Liu, Shuhong. Liu, Shuhong has 3 trademark applications. The latest application filed is for "VICAMOY"

Company Profile

LIU, SHUHONG
shuhong liu
Liu; Shuhong - Chandler AZ
LIU; Shuhong - Chandler AZ
Liu; Shuhong - Albany NY

Entity Type	INDIVIDUAL
Address	No. 165, South Village Shangnan Rd., Pudong New Area Shanghai CHINA 200120

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks Patents

Patent Applications

Patent Application	Date
NONDESTRUCTIVE OPTICAL DETECTION OF TRACE UNDERCUT, WIDTH AND THICKNESS 20170059303 - 14/840883 May; Robert Alan ; et al.	2017-03-02
INLINE INSPECTION OF THE CONTACT BETWEEN CONDUCTIVE TRACES AND SUBSTRATE FOR HIDDEN DEFECTS USING WHITE LIGHT INTERFEROMETER WITH TILTED OBJECTIVE LENS 20160245758 - 15/146812 Liu; Shuhong ; et al.	2016-08-25
INLINE MEASUREMENT OF MOLDING MATERIAL THICKNESS USING TERAHERTZ REFLECTANCE 20160093540 - 14/499120 LIU; Shuhong ; et al.	2016-03-31
CONTINUOUS FLOW CARBOXYLATION REACTION 20160090361 - 14/866085 Tweedie; Scott ; et al.	2016-03-31
INLINE INSPECTION OF THE CONTACT BETWEEN CONDUCTIVE TRACES AND SUBSTRATE FOR HIDDEN DEFECTS USING WHITE LIGHT INTERFEROMETER WITH TILTED OBJECTIVE LENS 20150276375 - 14/229446 Liu; Shuhong ; et al.	2015-10-01
Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens 9,746,428 - 15/146,812 Liu , et al. August 29, 2	2017-08-29
Inline measurement of molding material thickness using terahertz reflectance 9,508,610 - 14/499,120 Liu , et al. November 29, 2	2016-11-29
Metrology tool for electroless copper thickness measurement for BBUL process development monitoring 9,441,952 - 14/040,178 Ghosh , et al. September 13, 2	2016-09-13
Metrology tool for electroless copper thickness measurement for BBUL process development monitoring 9,441,952 - 14/040,178 Ghosh , et al. September 13, 2	2016-09-13
Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens 9,389,064 - 14/229,446 Liu , et al. July 12, 2	2016-07-12

Patent Grants & Applications

Trademark Applications

Mark Image Registration \| Serial	Trademark Application Date
"VICAMOY" 90323023	VICAMOY 2020-11-16
"FIMCOSY" 90323043	FIMCOSY 2020-11-16
"EARTH VILLAGE" 5333316 87272932	EARTH VILLAGE 2016-12-19

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