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Patent applications and USPTO patent grants for LIU; CHI-LUN.The latest application filed is for "method of preparing a semiconductor specimen for failure analysis".
Patent | Date |
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Method Of Preparing A Semiconductor Specimen For Failure Analysis App 20220155367 - LIU; CHI-LUN ;   et al. | 2022-05-19 |
A Remote Control Method Of Sample Preparation And/or Sample Analysis App 20220107332 - LIU; CHI-LUN ;   et al. | 2022-04-07 |
Artificial Intelligence Identified Measuring Method For A Semiconductor Image App 20210374927 - LIU; CHI-LUN ;   et al. | 2021-12-02 |
Method Of Preparing A Sample For Physical Analysis App 20210190707 - LIU; CHI-LUN ;   et al. | 2021-06-24 |
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