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name:-0.015923023223877
name:-0.014652967453003
name:-0.0027561187744141
Liou; Justin Dianhuan Patent Filings

Liou; Justin Dianhuan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Liou; Justin Dianhuan.The latest application filed is for "semiconductor inspection and metrology system using laser pulse multiplier".

Company Profile
2.12.11
  • Liou; Justin Dianhuan - Santa Clara CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
193nm laser and inspection system
Grant 10,439,355 - Chuang , et al. O
2019-10-08
Semiconductor inspection and metrology system using laser pulse multiplier
Grant 10,193,293 - Chuang , et al. Ja
2019-01-29
Semiconductor Inspection And Metrology System Using Laser Pulse Multiplier
App 20180233872 - Chuang; Yung-Ho ;   et al.
2018-08-16
Laser repetition rate multiplier and flat-top beam profile generators using mirrors and/or prisms
Grant 10,044,164 - Chuang , et al. August 7, 2
2018-08-07
193nm Laser And Inspection System
App 20180191126 - Chuang; Yung-Ho ;   et al.
2018-07-05
Semiconductor inspection and metrology system using laser pulse multiplier
Grant 9,972,959 - Chuang , et al. May 15, 2
2018-05-15
193nm laser and inspection system
Grant 9,935,421 - Chuang , et al. April 3, 2
2018-04-03
Semiconductor inspection and metrology system using laser pulse multiplier
Grant 9,793,673 - Chuang , et al. October 17, 2
2017-10-17
Semiconductor inspection and metrology system using laser pulse multiplier
Grant 9,768,577 - Chuang , et al. September 19, 2
2017-09-19
193 nm laser and an inspection system using a 193 nm laser
Grant 9,608,399 - Chuang , et al. March 28, 2
2017-03-28
193nm Laser And Inspection System
App 20170063026 - Chuang; Yung-Ho ;   et al.
2017-03-02
193nm laser and inspection system
Grant 9,529,182 - Chuang , et al. December 27, 2
2016-12-27
Laser repetition rate multiplier and flat-top beam profile generators using mirrors and/or prisms
Grant 9,525,265 - Chuang , et al. December 20, 2
2016-12-20
Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generators Using Mirrors And/or Prisms
App 20160359292 - Chuang; Yung-Ho Alex ;   et al.
2016-12-08
Semiconductor Inspection And Metrology System Using Laser Pulse Multiplier
App 20160285223 - Chuang; Yung-Ho ;   et al.
2016-09-29
193nm Laser And An Inspection System Using A 193nm Laser
App 20160056606 - Chuang; Yung-Ho ;   et al.
2016-02-25
Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generators Using Mirrors And/Or Prisms
App 20150372446 - Chuang; Yung-Ho Alex ;   et al.
2015-12-24
Semiconductor Inspection And Metrology System Using Laser Pulse Multiplier
App 20150364895 - Chuang; Yung-Ho Alex ;   et al.
2015-12-17
Semiconductor inspection and metrology system using laser pulse multiplier
Grant 9,151,940 - Chuang , et al. October 6, 2
2015-10-06
193nm Laser And Inspection System
App 20140226140 - Chuang; Yung-Ho ;   et al.
2014-08-14
Semiconductor Inspection And Metrology System Using Laser Pulse Multiplier
App 20140153596 - Chuang; Yung-Ho Alex ;   et al.
2014-06-05
Semiconductor Inspection And Metrology System Using Laser Pulse Multiplier
App 20120314286 - Chuang; Yung-Ho ;   et al.
2012-12-13

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