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Patent applications and USPTO patent grants for Linholm; Loren W..The latest application filed is for "monocrystalline test and reference structures, and use for calibrating instruments".
Patent | Date |
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Monocrystalline test and reference structures, and use for calibrating instruments Grant 5,920,067 - Cresswell , et al. July 6, 1 | 1999-07-06 |
Electrical test structure and method for measuring the relative locations of conductive features on an insulating substrate Grant 5,857,258 - Penzes , et al. January 12, 1 | 1999-01-12 |
Method and reference standards for measuring overlay in multilayer structures, and for calibrating imaging equipment as used in semiconductor manufacturing Grant 5,617,340 - Cresswell , et al. April 1, 1 | 1997-04-01 |
Electrical test structure and method for measuring the relative locations of conducting features on an insulating substrate Grant 5,602,492 - Cresswell , et al. February 11, 1 | 1997-02-11 |
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