Linder; Barry P.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Linder; Barry P..The latest application filed is for "analytics to determine customer satisfaction".

Company Profile

10.59.58

Linder; Barry P. - Hastings-on-Hudson NY
Linder; Barry P. - Hastings-upon-Hudson NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Measuring individual device degradation in CMOS circuits Grant 10,901,025 - Linder , et al. January 26, 2	2021-01-26
BTI degradation test circuit Grant 10,782,336 - Jenkins , et al. Sept	2020-09-22
Dynamic predictor of semiconductor lifetime limits Grant 10,746,785 - Cher , et al. A	2020-08-18
Analytics to determine customer satisfaction Grant 10,671,958 - Balakrishnan , et al.	2020-06-02
Reduction of negative bias temperature instability Grant 10,622,355 - Ando , et al.	2020-04-14
Reducing dark current in germanium photodiodes by electrical over-stress Grant 10,608,138 - Linder , et al.	2020-03-31
Non-destructive analysis to determine use history of processor Grant 10,552,278 - Jenkins , et al. Fe	2020-02-04
Touch movement activation for gaining access beyond a restricted access gateway Grant 10,433,173 - Jenkins , et al. O	2019-10-01
Analytics To Determine Customer Satisfaction App 20190266538 - Balakrishnan; Karthik ; et al.	2019-08-29
Analytics to determine customer satisfaction Grant 10,360,526 - Balakrishnan , et al.	2019-07-23
Three plate MIM capacitor via integrity verification Grant 10,262,934 - Kim , et al.	2019-04-16
Measuring individual device degradation in CMOS circuits Grant 10,247,769 - Linder , et al.	2019-04-02
Reducing dark current in germanium photodiodes by electrical over-stress Grant 10,249,785 - Linder , et al.	2019-04-02
Reducing dark current in germanium photodiodes by electrical over-stress Grant 10,236,407 - Linder , et al.	2019-03-19
Three plate MIM capacitor via integrity verification Grant 10,229,873 - Kim , et al.	2019-03-12
Reduction of negative bias temperature instability Grant 10,192,869 - Ando , et al. Ja	2019-01-29
Reduction Of Negative Bias Temperature Instability App 20190013315 - Ando; Takashi ; et al.	2019-01-10
Measuring Individual Device Degradation In Cmos Circuits App 20180364296 - Linder; Barry P. ; et al.	2018-12-20
Reduction of negative bias temperature instability Grant 10,134,732 - Ando , et al. November 20, 2	2018-11-20
Non-destructive Analysis To Determine Use History Of Processor App 20180322025 - Jenkins; Keith A. ; et al.	2018-11-08
Test structures for dielectric reliability evaluations Grant 10,103,060 - Brochu, Jr. , et al. October 16, 2	2018-10-16
Non-destructive analysis to determine use history of processor Grant 10,102,090 - Jenkins , et al. October 16, 2	2018-10-16
Reducing Dark Current In Germanium Photodiodes By Electrical Over-stress App 20180277709 - Linder; Barry P. ; et al.	2018-09-27
Three Plate Mim Capacitor Via Integrity Verification App 20180226338 - Kim; Andrew T. ; et al.	2018-08-09
Three Plate Mim Capacitor Via Integrity Verification App 20180226339 - Kim; Andrew T. ; et al.	2018-08-09
Reducing dark current in germanium photodiodes by electrical over-stress Grant 10,043,938 - Linder , et al. August 7, 2	2018-08-07
Measurement for transistor output characteristics with and without self heating Grant 9,952,274 - Jenkins , et al. April 24, 2	2018-04-24
Selective thickening of pFET dielectric Grant 9,941,371 - Ando , et al. April 10, 2	2018-04-10
Touch movement activation for gaining access beyond a restricted access gateway Grant 9,906,960 - Jenkins , et al. February 27, 2	2018-02-27
Reducing Dark Current In Germanium Photodiodes By Electrical Over-stress App 20180053875 - Linder; Barry P. ; et al.	2018-02-22
Dynamic Predictor Of Semiconductor Lifetime Limits App 20180038906 - Cher; Chen-Yong ; et al.	2018-02-08
Touch Movement Activation For Gaining Access Beyond A Restricted Access Gateway App 20180035298 - Jenkins; Keith A. ; et al.	2018-02-01
Analytics To Determine Customer Satisfaction App 20180032939 - Balakrishnan; Karthik ; et al.	2018-02-01
Test circuit to isolate HCI degradation Grant 9,866,221 - Jenkins , et al. January 9, 2	2018-01-09
On-chip leakage measurement Grant 9,863,994 - Cher , et al. January 9, 2	2018-01-09
Reducing dark current in germanium photodiodes by electrical over-stress Grant 9,853,179 - Linder , et al. December 26, 2	2017-12-26
Reducing Dark Current In Germanium Photodiodes By Electrical Over-stress App 20170365735 - Linder; Barry P. ; et al.	2017-12-21
Test Circuit To Isolate Hci Degradation App 20170346492 - Jenkins; Keith A. ; et al.	2017-11-30
Hydroxyl group termination for nucleation of a dielectric metallic oxide Grant 9,831,084 - Ando , et al. November 28, 2	2017-11-28
Non-destructive Analysis To Determine Use History Of Processor App 20170329685 - Jenkins; Keith A. ; et al.	2017-11-16
Touch Movement Activation For Gaining Access Beyond A Restricted Access Gateway App 20170325093 - Jenkins; Keith A. ; et al.	2017-11-09
Circuit to detect previous use of computer chips using passive test wires Grant 9,791,500 - Jenkins , et al. October 17, 2	2017-10-17
Circuit to detect previous use of computer chips using passive test wires Grant 9,791,499 - Jenkins , et al. October 17, 2	2017-10-17
Bti Degradation Test Circuit App 20170276728 - Jenkins; Keith A. ; et al.	2017-09-28
On-chip Leakage Measurement App 20170254846 - Cher; Chen-Yong ; et al.	2017-09-07
Reducing dark current in germanium photodiodes by electrical over-stress Grant 9,755,100 - Linder , et al. September 5, 2	2017-09-05
Reducing Dark Current In Germanium Photodiodes By Electrical Over-stress App 20170222084 - Linder; Barry P. ; et al.	2017-08-03
Reducing Dark Current In Germanium Photodiodes By Electrical Over-stress App 20170221779 - Linder; Barry P. ; et al.	2017-08-03
Reducing Dark Current In Germanium Photodiodes By Electrical Over-stress App 20170222083 - Linder; Barry P. ; et al.	2017-08-03
Measurement for transistor output characteristics with and without self heating Grant 9,678,141 - Jenkins , et al. June 13, 2	2017-06-13
Method to improve reliability of high-K metal gate stacks Grant 9,634,116 - Ando , et al. April 25, 2	2017-04-25
Measuring Individual Device Degradation In Cmos Circuits App 20170059644 - Linder; Barry P. ; et al.	2017-03-02
Selective thickening of PFET dielectric Grant 9,570,569 - Ando , et al. February 14, 2	2017-02-14
Test Structures For Dielectric Reliability Evaluations App 20160372389 - Brochu, JR.; David G. ; et al.	2016-12-22
Selective Thickening Of Pfet Dielectric App 20160343622 - Ando; Takashi ; et al.	2016-11-24
Circuit To Detect Previous Use Of Computer Chips Using Passive Test Wires App 20160341788 - Jenkins; Keith A. ; et al.	2016-11-24
Selective thickening of pFET dielectric Grant 9,496,183 - Ando , et al. November 15, 2	2016-11-15
Selective Thickening Of Pfet Dielectric App 20160329254 - Ando; Takashi ; et al.	2016-11-10
Selective Thickening Of Pfet Dielectric App 20160329409 - Ando; Takashi ; et al.	2016-11-10
Measurement For Transistor Output Characteristics With And Without Self Heating App 20160266196 - Jenkins; Keith A. ; et al.	2016-09-15
Measurement For Transistor Output Characteristics With And Without Self Heating App 20160266195 - Jenkins; Keith A. ; et al.	2016-09-15
Reduction Of Negative Bias Temperature Instability App 20160197073 - Ando; Takashi ; et al.	2016-07-07
Method To Improve Reliability Of High-k Metal Gate Stacks App 20160181397 - Ando; Takashi ; et al.	2016-06-23
Hydroxyl group termination for nucleation of a dielectric metallic oxide Grant 9,373,501 - Ando , et al. June 21, 2	2016-06-21
Monitoring aging of silicon in an integrated circuit device Grant 9,310,424 - Allen-Ware , et al. April 12, 2	2016-04-12
Method to improve reliability of high-K metal gate stacks Grant 9,299,802 - Ando , et al. March 29, 2	2016-03-29
Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations Grant 9,287,185 - Bonilla , et al. March 15, 2	2016-03-15
Multi-plasma nitridation process for a gate dielectric Grant 9,252,232 - Chudzik , et al. February 2, 2	2016-02-02
Hydroxyl Group Termination For Nucleation Of A Dielectric Metallic Oxide App 20160027640 - Ando; Takashi ; et al.	2016-01-28
Circuit To Detect Previous Use Of Computer Chips Using Passive Test Wires App 20150338454 - Jenkins; Keith A. ; et al.	2015-11-26
Multi-plasma nitridation process for a gate dielectric Grant 9,196,700 - Chudzik , et al. November 24, 2	2015-11-24
Reduction Of Negative Bias Temperature Instability App 20150287649 - Ando; Takashi ; et al.	2015-10-08
Reducing performance degradation in backup semiconductor chips Grant 9,110,777 - Bansal , et al. August 18, 2	2015-08-18
Multi-plasma Nitridation Process For A Gate Dielectric App 20150187901 - Chudzik; Michael P. ; et al.	2015-07-02
Multi-plasma Nitridation Process For A Gate Dielectric App 20150179459 - Chudzik; Michael P. ; et al.	2015-06-25
Multi-plasma nitridation process for a gate dielectric Grant 9,006,064 - Chudzik , et al. April 14, 2	2015-04-14
Intrinsic Channel Planar Field Effect Transistors Having Multiple Threshold Voltages App 20150021698 - Ando; Takashi ; et al.	2015-01-22
Hydroxyl Group Termination For Nucleation Of A Dielectric Metallic Oxide App 20140308821 - Ando; Takashi ; et al.	2014-10-16
Structure and method to form input/output devices Grant 8,836,037 - Ando , et al. September 16, 2	2014-09-16
Multi-plasma Nitridation Process For A Gate Dielectric App 20140252503 - Chudzik; Michael P. ; et al.	2014-09-11
Monitoring Aging of Silicon in an Integrated Circuit Device App 20140244212 - Allen-Ware; Malcolm S. ; et al.	2014-08-28
Bulk finFET with super steep retrograde well Grant 8,815,684 - Cai , et al. August 26, 2	2014-08-26
Bulk finFET with super steep retrograde well Grant 8,809,872 - Cai , et al. August 19, 2	2014-08-19
Bulk Finfet With Super Steep Retrograde Well App 20140159162 - CAI; JIN ; et al.	2014-06-12
Bulk Finfet With Super Steep Retrograde Well App 20140159163 - CAI; JIN ; et al.	2014-06-12
Method to Improve Reliability of High-k Metal Gate Stacks App 20140120707 - Ando; Takashi ; et al.	2014-05-01
Managing aging of silicon in an integrated circuit device Grant 8,713,490 - Allen-Ware , et al. April 29, 2	2014-04-29
Structure And Method To Form Input/output Devices App 20140042546 - Ando; Takashi ; et al.	2014-02-13
Metal gate CMOS with at least a single gate metal and dual gate dielectrics Grant 8,569,844 - Doris , et al. October 29, 2	2013-10-29
Reducing Performance Degradation In Backup Semiconductor Chips App 20130212414 - Bansal; Aditya ; et al.	2013-08-15
High performance CMOS circuits, and methods for fabricating same Grant 8,383,483 - Arnold , et al. February 26, 2	2013-02-26
Using metal/metal nitride bilayers as gate electrodes in self-aligned aggressively scaled CMOS devices Grant 7,999,323 - Cartier , et al. August 16, 2	2011-08-16
Low threshold voltage semiconductor device with dual threshold voltage control means Grant 7,858,500 - Cartier , et al. December 28, 2	2010-12-28
Metal gate CMOS with at least a single gate metal and dual gate dielectrics Grant 7,709,902 - Doris , et al. May 4, 2	2010-05-04
METAL GATES WITH LOW CHARGE TRAPPING AND ENHANCED DIELECTRIC RELIABILITY CHARACTERISTICS FOR HIGH-k GATE DIELECTRIC STACKS App 20100044805 - Callegari; Alessandro C. ; et al.	2010-02-25
Method of fabricating a metal gate CMOS with at least a single gate metal and dual gate dielectrics Grant 7,666,732 - Doris , et al. February 23, 2	2010-02-23
High Performance Cmos Circuits, And Methods For Fabricating Same App 20100041221 - Arnold; John C. ; et al.	2010-02-18
Low threshold voltage semiconductor device with dual threshold voltage control means Grant 7,655,994 - Cartier , et al. February 2, 2	2010-02-02
Using Metal/Metal Nitride Bilayers as Gate Electrodes in Self-Aligned Aggressively Scaled CMOS Devices App 20090302399 - Cartier; Eduard A. ; et al.	2009-12-10
Metal gates with low charge trapping and enhanced dielectric reliability characteristics for high-k gate dielectric stacks Grant 7,611,979 - Callegari , et al. November 3, 2	2009-11-03
Using metal/metal nitride bilayers as gate electrodes in self-aligned aggressively scaled CMOS devices Grant 7,598,545 - Cartier , et al. October 6, 2	2009-10-06
Metal Gate Cmos With At Least A Single Gate Metal And Dual Gate Dielectrics App 20090008719 - Doris; Bruce B. ; et al.	2009-01-08
Metal Gate Cmos With At Least A Single Gate Metal And Dual Gate Dielectrics App 20090008720 - Doris; Bruce B. ; et al.	2009-01-08
Metal Gate Cmos With At Least A Single Gate Metal And Dual Gate Dielectrics App 20090011552 - Doris; Bruce B. ; et al.	2009-01-08
Metal gate CMOS with at least a single gate metal and dual gate dielectrics Grant 7,432,567 - Doris , et al. October 7, 2	2008-10-07
METAL GATES WITH LOW CHARGE TRAPPING AND ENHANCED DIELECTRIC RELIABILITY CHARACTERISTICS FOR HIGH-k GATE DIELECTRIC STACKS App 20080191292 - Callegari; Alessandro C. ; et al.	2008-08-14
Low Threshold Voltage Semiconductor Device With Dual Threshold Voltage Control Means App 20080182389 - Cartier; Eduard A. ; et al.	2008-07-31
High performance CMOS circuits, and methods for fabricating the same App 20070152276 - Arnold; John C. ; et al.	2007-07-05
Metal gate CMOS with at least a single gate metal and dual gate dielectrics App 20070148838 - Doris; Bruce B. ; et al.	2007-06-28
Low threshold voltage semiconductor device with dual threshold voltage control means App 20070090471 - Cartier; Eduard A. ; et al.	2007-04-26
Using metal/metal nitride bilayers as gate electrodes in self-aligned aggressively scaled CMOS devices App 20060237796 - Cartier; Eduard A. ; et al.	2006-10-26

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