Lin; Xijiang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lin; Xijiang.The latest application filed is for "library cell modeling for transistor-level test pattern generation".

Company Profile

5.22.20

Lin; Xijiang - West Linn OR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Library Cell Modeling For Transistor-level Test Pattern Generation App 20220065929 - Lin; Xijiang ; et al.	2022-03-03
Deterministic test pattern generation for designs with timing exceptions Grant 10,977,400 - Cheng , et al. April 13, 2	2021-04-13
Deterministic Test Pattern Generation For Designs With Timing Exceptions App 20200410065 - Cheng; Wu-Tung ; et al.	2020-12-31
Timing-aware test generation and fault simulation Grant 10,509,073 - Lin , et al. Dec	2019-12-17
Scan cell selection for partial scan designs Grant 10,372,855 - Lin , et al.	2019-08-06
Transition test generation for detecting cell internal defects Grant 10,222,420 - Lin , et al.	2019-03-05
Timing-aware Test Generation And Fault Simulation App 20180045780 - Lin; Xijiang ; et al.	2018-02-15
Timing-aware test generation and fault simulation Grant 9,720,040 - Lin , et al. August 1, 2	2017-08-01
Transition Test Generation For Detecting Cell Internal Defects App 20170193155 - Lin; Xijiang ; et al.	2017-07-06
Logic built-in self-test with high test coverage and low switching activity Grant 9,568,552 - Lin , et al. February 14, 2	2017-02-14
Identification of power sensitive scan cells Grant 9,501,589 - Lin , et al. November 22, 2	2016-11-22
Dynamic shift for test pattern compression Grant 9,335,374 - Lin , et al. May 10, 2	2016-05-10
Timing-aware Test Generation And Fault Simulation App 20150323600 - Lin; Xijiang ; et al.	2015-11-12
Scan Cell Selection For Partial Scan Designs App 20150248515 - Lin; Xijiang ; et al.	2015-09-03
Timing-aware test generation and fault simulation Grant 9,086,454 - Lin , et al. July 21, 2	2015-07-21
Dynamic Shift For Test Pattern Compression App 20150153410 - Lin; Xijiang ; et al.	2015-06-04
Test data volume reduction based on test cube properties Grant 8,996,941 - Lin , et al. March 31, 2	2015-03-31
Identification Of Power Sensitive Scan Cells App 20150040087 - Lin; Xijiang ; et al.	2015-02-05
Logic Built-In Self-Test with High Test Coverage and Low Switching Activity App 20140365840 - Lin; Xijiang ; et al.	2014-12-11
Scan cell use with reduced power consumption Grant 8,890,563 - Lin , et al. November 18, 2	2014-11-18
Timing-aware Test Generation And Fault Simulation App 20140047404 - Lin; Xijiang ; et al.	2014-02-13
Test Data Volume Reduction Based On Test Cube Properties App 20130332786 - Lin; Xijiang ; et al.	2013-12-12
Timing-aware test generation and fault simulation Grant 8,560,906 - Lin , et al. October 15, 2	2013-10-15
At-speed scan testing with controlled switching activity Grant 8,499,209 - Rajski , et al. July 30, 2	2013-07-30
Low power scan testing techniques and apparatus Grant 8,290,738 - Lin , et al. October 16, 2	2012-10-16
Timing-aware Test Generation And Fault Simulation App 20120174049 - Lin; Xijiang ; et al.	2012-07-05
Scan Cell Use With Reduced Power Consumption App 20120043991 - Lin; Xijiang ; et al.	2012-02-23
Timing-aware test generation and fault simulation Grant 8,051,352 - Lin , et al. November 1, 2	2011-11-01
Low Power Scan Testing Techniques And Apparatus App 20110166818 - Lin; Xijiang ; et al.	2011-07-07
Low power scan testing techniques and apparatus Grant 7,925,465 - Lin , et al. April 12, 2	2011-04-12
Test generation methods for reducing power dissipation and supply currents Grant 7,865,792 - Lin , et al. January 4, 2	2011-01-04
At-Speed Scan Testing With Controlled Switching Activity App 20100275077 - Rajski; Janusz ; et al.	2010-10-28
Test Generation Methods For Reducing Power Dissipation And Supply Currents App 20100146350 - Lin; Xijiang ; et al.	2010-06-10
Test generation methods for reducing power dissipation and supply currents Grant 7,685,491 - Lin , et al. March 23, 2	2010-03-23
Low power scan testing techniques and apparatus App 20080195346 - Lin; Xijiang ; et al.	2008-08-14
Timing-aware test generation and fault simulation App 20070288822 - Lin; Xijiang ; et al.	2007-12-13
Test generation methods for reducing power dissipation and supply currents App 20070250749 - Lin; Xijiang ; et al.	2007-10-25

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