loadpatents
Patent applications and USPTO patent grants for Lin; Sung-Chieh.The latest application filed is for "memory device with determined time window".
Patent | Date |
---|---|
Memory device with determined time window Grant 9,990,985 - Hsu , et al. June 5, 2 | 2018-06-05 |
Memory Device With Determined Time Window App 20180151219 - Hsu; Kuoyuan ;   et al. | 2018-05-31 |
Integrated circuit structure Grant 9,966,378 - Yen , et al. May 8, 2 | 2018-05-08 |
Generating stabilized output signals during fuse read operations Grant 9,558,841 - Lin , et al. January 31, 2 | 2017-01-31 |
Integrated Circuit Structure App 20160379983 - YEN; David ;   et al. | 2016-12-29 |
Integrated circuit structure to resolve deep-well plasma charging problem and method of forming the same Grant 9,449,888 - Yen , et al. September 20, 2 | 2016-09-20 |
Writing data to a memory cell Grant 9,412,438 - Fan , et al. August 9, 2 | 2016-08-09 |
Method and apparatus for bit cell repair Grant 9,177,668 - Lin , et al. November 3, 2 | 2015-11-03 |
Memory error correction Grant 9,135,099 - Chen , et al. September 15, 2 | 2015-09-15 |
Tracking mechanism Grant 9,117,506 - Hsu , et al. August 25, 2 | 2015-08-25 |
Writing Data To A Memory Cell App 20150213880 - FAN; Kai ;   et al. | 2015-07-30 |
Tracking Mechanism App 20150187397 - HSU; Kuoyuan (Peter) ;   et al. | 2015-07-02 |
Integrated Circuit Structure To Resolve Deep-well Plasma Charging Problem And Method Of Forming The Same App 20150140748 - YEN; David ;   et al. | 2015-05-21 |
Integrated circuit structure to resolve deep-well plasma charging problem and method of forming the same Grant 8,946,825 - Yen , et al. February 3, 2 | 2015-02-03 |
Generating Output Signal During Read Operation App 20140369105 - LIN; Sung-Chieh ;   et al. | 2014-12-18 |
Metal-via fuse Grant 8,847,350 - Lin , et al. September 30, 2 | 2014-09-30 |
Electrical fuse memory Grant 8,824,234 - Lin , et al. September 2, 2 | 2014-09-02 |
Word line driver having a control switch Grant 8,787,109 - Liao , et al. July 22, 2 | 2014-07-22 |
Circuit and method for generating a read signal Grant 8,767,498 - Huang , et al. July 1, 2 | 2014-07-01 |
Electrical fuse memory arrays Grant 8,760,955 - Liao , et al. June 24, 2 | 2014-06-24 |
Sense amplifier Grant 8,692,580 - Hung , et al. April 8, 2 | 2014-04-08 |
Metal-via Fuse App 20140061851 - LIN; Sung-Chieh ;   et al. | 2014-03-06 |
Non-salicide polysilicon fuse Grant 8,625,324 - Lin , et al. January 7, 2 | 2014-01-07 |
Current leakage reduction Grant 8,614,927 - Lin , et al. December 24, 2 | 2013-12-24 |
Word Line Driver Having A Control Switch App 20130301374 - LIAO; Wei-Li ;   et al. | 2013-11-14 |
Method And Apparatus For Bit Cell Repair App 20130272080 - LIN; Sung-Chieh ;   et al. | 2013-10-17 |
Memory Error Correction App 20130262962 - CHEN; Yun-Han ;   et al. | 2013-10-03 |
Integrated Circuit Structure To Resolve Deep-well Plasma Charging Problem And Method Of Forming The Same App 20130256801 - YEN; David ;   et al. | 2013-10-03 |
Electrical fuse bit cell Grant 8,542,549 - Lin , et al. September 24, 2 | 2013-09-24 |
Sense Amplifier App 20130221995 - Hung; Chen-Ming ;   et al. | 2013-08-29 |
One time programming bit cell Grant 8,482,952 - Lin , et al. July 9, 2 | 2013-07-09 |
Electrical Fuse Memory App 20130155799 - LIN; Sung-Chieh ;   et al. | 2013-06-20 |
Voltage level shifter Grant 8,466,732 - Chen , et al. June 18, 2 | 2013-06-18 |
Method and apparatus for bit cell repair Grant 8,467,258 - Lin , et al. June 18, 2 | 2013-06-18 |
Circuit And Method For Generating A Read Signal App 20130107603 - HUANG; Jiann-Tseng ;   et al. | 2013-05-02 |
Electrical Fuse Memory Arrays App 20130100756 - LIAO; Wei-Li ;   et al. | 2013-04-25 |
Electrical fuse programming time control scheme Grant 8,427,857 - Chen , et al. April 23, 2 | 2013-04-23 |
Testing one time programming devices Grant 8,411,483 - Lin , et al. April 2, 2 | 2013-04-02 |
Electrical fuse memory Grant 8,400,860 - Lin , et al. March 19, 2 | 2013-03-19 |
Electrical Fuse Bit Cell App 20130039117 - LIN; Sung-Chieh ;   et al. | 2013-02-14 |
Voltage Level Shifter App 20130038375 - LIN; Sung-Chieh ;   et al. | 2013-02-14 |
Current Leakage Reduction App 20120320700 - LIN; Sung-Chieh ;   et al. | 2012-12-20 |
Non-salicide Polysilicon Fuse App 20120257435 - LIN; Sung-Chieh ;   et al. | 2012-10-11 |
Current leakage reduction Grant 8,270,240 - Lin , et al. September 18, 2 | 2012-09-18 |
One Time Programming Bit Cell App 20120212993 - LIN; Sung-Chieh ;   et al. | 2012-08-23 |
Circuit and method for characterizing the performance of a sense amplifier Grant 8,207,783 - Liao , et al. June 26, 2 | 2012-06-26 |
Electrical fuse memory arrays Grant 8,194,490 - Chen , et al. June 5, 2 | 2012-06-05 |
Voltage Level Shifter App 20120086495 - CHEN; Po-Hung ;   et al. | 2012-04-12 |
High Voltage Tolerative Driver App 20120081165 - HUANG; Jiann-Tseng ;   et al. | 2012-04-05 |
Electrical Fuse Memory Arrays App 20120057423 - CHEN; Po-Hung ;   et al. | 2012-03-08 |
Method And Apparatus For Bit Cell Repair App 20120051162 - Lin; Sung-Chieh ;   et al. | 2012-03-01 |
Circuit And Method For Characterizing The Performance Of A Sense Amplifier App 20120038410 - LIAO; Wei-Li ;   et al. | 2012-02-16 |
Electrical Fuse Memory App 20120020177 - LIN; Sung-Chieh ;   et al. | 2012-01-26 |
Electrical Fuse Programming Time Control Scheme App 20110273949 - CHEN; Po-Hung ;   et al. | 2011-11-10 |
Stack resistor structure for integrated circuits Grant 7,919,832 - Hsueh , et al. April 5, 2 | 2011-04-05 |
Current Leakage Reduction App 20110026354 - Lin; Sung-Chieh ;   et al. | 2011-02-03 |
Testing One Time Programming Devices App 20110007542 - LIN; Sung-Chieh ;   et al. | 2011-01-13 |
Methods of testing fuse elements for memory devices Grant 7,733,096 - Lin , et al. June 8, 2 | 2010-06-08 |
High Voltage Tolerative Driver Circuit App 20090243705 - Huang; Jiann-Tseng ;   et al. | 2009-10-01 |
Repair circuitry with an enhanced ESD protection device Grant 7,551,415 - Tsai , et al. June 23, 2 | 2009-06-23 |
Electrical fuse device with dummy cells for ESD protection Grant 7,462,894 - Lin , et al. December 9, 2 | 2008-12-09 |
Methods of testing fuse elements for memory devices App 20080238439 - Lin; Sung-Chieh ;   et al. | 2008-10-02 |
Stack resistor structure for integrated circuits App 20080169514 - Hsueh; Fu-Lung ;   et al. | 2008-07-17 |
Sense amplifier with leakage compensation for electrical fuses Grant 7,394,637 - Lin , et al. July 1, 2 | 2008-07-01 |
Repair circuitry with an enhanced ESD protection device App 20080137251 - Lin; Sung-Chieh ;   et al. | 2008-06-12 |
Repair circuitry with an enhanced ESD protection device App 20080062605 - Tsai; Ming-Hsien ;   et al. | 2008-03-13 |
Electrical fuse device with dummy cells for ESD protection App 20070206401 - Lin; Sung-Chieh ;   et al. | 2007-09-06 |
Sense amplifier with leakage compensation for electrical fuses App 20070139843 - Lin; Sung-Chieh ;   et al. | 2007-06-21 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.