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Patent applications and USPTO patent grants for Lin; Sheng-Lin.The latest application filed is for "circuit for testing memory".
Patent | Date |
---|---|
Memory device test circuit and memory device test method Grant 11,404,134 - Lin , et al. August 2, 2 | 2022-08-02 |
Circuit for testing memory App 20220180956 - LIN; SHENG-LIN ;   et al. | 2022-06-09 |
Circuit And Associated Chip App 20220130481 - LIN; SHENG-LIN ;   et al. | 2022-04-28 |
Test system Grant 11,170,867 - Lin , et al. November 9, 2 | 2021-11-09 |
Memory device test circuit and memory device test method App 20210027854 - LIN; SHENG-LIN ;   et al. | 2021-01-28 |
Test System App 20200273532 - LIN; Shih-Chieh ;   et al. | 2020-08-27 |
Method For Inspecting Screen App 20160153916 - LIN; Sheng-Lin | 2016-06-02 |
Seismic brace with a removable restraining member disposed around a middle portion of an elongated central brace unit Grant 7,373,758 - Tsai , et al. May 20, 2 | 2008-05-20 |
Seismic brace with a removable restraining member disposed around a middle portion of an elongated central brace unit App 20070240368 - Tsai; Keh-Chyuan ;   et al. | 2007-10-18 |
Seismic brace with a removable restraining member disposed around a middle portion of an elongated central brace unit App 20040190981 - Tsai, Keh-Chyuan ;   et al. | 2004-09-30 |
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