loadpatents
Patent applications and USPTO patent grants for Lin; Qun Ying.The latest application filed is for "determination of lithography tool process condition".
Patent | Date |
---|---|
Litho scanner alignment signal improvement Grant 9,034,720 - Liu , et al. May 19, 2 | 2015-05-19 |
Determination Of Lithography Tool Process Condition App 20140170539 - ZHOU; Wenzhan ;   et al. | 2014-06-19 |
Determination of lithography tool process condition Grant 8,741,511 - Zhou , et al. June 3, 2 | 2014-06-03 |
Litho Scanner Alignment Signal Improvement App 20140050439 - LIU; Hui ;   et al. | 2014-02-20 |
Waferless Measurement Recipe App 20140019927 - YUDHISTIRA; Yasri ;   et al. | 2014-01-16 |
Mask and method to pattern chromeless phase lithography contact hole Grant 8,057,968 - Tan , et al. November 15, 2 | 2011-11-15 |
Monitoring structure Grant 7,866,224 - Tan , et al. January 11, 2 | 2011-01-11 |
Mask And Method To Pattern Chromeless Phase Lithography Contact Hole App 20100196805 - TAN; Sia Kim ;   et al. | 2010-08-05 |
Mask and method to pattern chromeless phase lithography contact hole Grant 7,655,388 - Tan , et al. February 2, 2 | 2010-02-02 |
Monitoring Structure App 20080127998 - Tan; Sia Kim ;   et al. | 2008-06-05 |
Method for dual damascene patterning with single exposure using tri-tone phase shift mask Grant 7,288,366 - Tan , et al. October 30, 2 | 2007-10-30 |
Mask and method to pattern chromeless phase lithography contact hole App 20060147813 - Tan; Sya Kim ;   et al. | 2006-07-06 |
Structure and method to fabricate a protective sidewall liner for an optical mask App 20060105520 - Tan; Sia Kim ;   et al. | 2006-05-18 |
Half tone alternating phase shift masks Grant 7,014,962 - Lin , et al. March 21, 2 | 2006-03-21 |
Method for dual damascene patterning with single exposure using tri-tone phase shift mask App 20050089763 - Tan, Sia Kim ;   et al. | 2005-04-28 |
Half tone alternating phase shift masks App 20050058912 - Lin, Qun Ying ;   et al. | 2005-03-17 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.