Lin; Ming-Shiang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lin; Ming-Shiang.The latest application filed is for "transistor with a negative capacitance and a method of creating the same".

Company Profile

18.10.15

Lin; Ming-Shiang - Hsinchu TW
LIN; Ming-Shiang - Hsinchu City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Transistor With A Negative Capacitance And A Method Of Creating The Same App 20220302315 - Yuan; Feng ; et al.	2022-09-22
Semiconductor device with Fin end spacer dummy gate and method of manufacturing the same Grant 11,444,174 - Chang , et al. September 13, 2	2022-09-13
Transistor with a negative capacitance and a method of creating the same Grant 11,387,360 - Yuan , et al. July 12, 2	2022-07-12
Transparent Refraction Structure For An Image Sensor And Methods Of Forming The Same App 20210375970 - LIN; Ming-Shiang ; et al.	2021-12-02
Transistor with a negative capacitance and a method of creating the same Grant 11,189,726 - Yuan , et al. November 30, 2	2021-11-30
Ferroelectric Semiconductor Device and Method App 20210119050 - Ho; Chia-Cheng ; et al.	2021-04-22
Semiconductor Structure And Testing Method Thereof App 20210057290 - LIN; Ming-Shiang ; et al.	2021-02-25
Semiconductor Test Device And Manufacturing Method Thereof App 20210018544 - PENG; Cheng-Yi ; et al.	2021-01-21
Semiconductor structure and testing method thereof Grant 10,818,562 - Lin , et al. October 27, 2	2020-10-27
Semiconductor device with fin end spacer dummy gate and method of manufacturing the same Grant 10,797,174 - Chang , et al. October 6, 2	2020-10-06
Transistor With A Negative Capacitance And A Method Of Creating The Same App 20200273996 - Yuan; Feng ; et al.	2020-08-27
Transistor With A Negative Capacitance And A Method Of Creating The Same App 20200273997 - Yuan; Feng ; et al.	2020-08-27
Semiconductor test device and manufacturing method thereof Grant 10,732,209 - Peng , et al.	2020-08-04
Transistor with a negative capacitance and a method of creating the same Grant 10,707,347 - Yuan , et al.	2020-07-07
Semiconductor test device and manufacturing method thereof Grant 10,670,641 - Peng , et al.	2020-06-02
Transistor With A Negative Capacitance And A Method Of Creating The Same App 20200127138 - Yuan; Feng ; et al.	2020-04-23
Semiconductor Device With Fin End Spacer Dummy Gate And Method Of Manufacturing The Same App 20200058784 - CHANG; Kai-Tai ; et al.	2020-02-20
Semiconductor Device With Fin End Spacer Dummy Gate And Method Of Manufacturing The Same App 20200058763 - CHANG; Kai-Tai ; et al.	2020-02-20
Semiconductor Test Device And Manufacturing Method Thereof App 20200033388 - PENG; Cheng-Yi ; et al.	2020-01-30
Method of manufacturing a semiconductor device having a gate with ferroelectric layer Grant 10,505,040 - Ho , et al. Dec	2019-12-10
Fin patterning for semiconductor devices Grant 10,395,937 - Tsai , et al. A	2019-08-27
Semiconductor Structure And Testing Method Thereof App 20190164850 - LIN; Ming-Shiang ; et al.	2019-05-30
Method Of Manufacturing A Semiconductor Device App 20190097061 - HO; Chia-Cheng ; et al.	2019-03-28
Fin Patterning for Semiconductor Devices App 20190067020 - Tsai; Tzung-Yi ; et al.	2019-02-28
Semiconductor Test Device And Manufacturing Method Thereof App 20190064238 - PENG; Cheng-Yi ; et al.	2019-02-28

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