Lin; Long-Hui
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lin; Long-Hui.The latest application filed is for "wafer defect detection methods and systems".
- Lin; Long-Hui - Hsin-Chu Hsien TW
- Lin; Long-Hui - Hsinchu County TW
- Lin; Long-Hui - Hsin-Chu TW
- Lin, Long-Hui - Hsin-Chu City TW
| Patent | Date |
|---|---|
| Method of defect inspection Grant 7,382,451 - Lin , et al. June 3, 2 | 2008-06-03 |
| Wafer defect detection methods and systems Grant 7,193,698 - Lin , et al. March 20, 2 | 2007-03-20 |
| Wafer Defect Detection Methods And Systems App 20070013900 - Lin; Long-Hui ; et al. | 2007-01-18 |
| Inspection methods for a semiconductor device Grant 7,132,354 - Lin , et al. November 7, 2 | 2006-11-07 |
| Method of defect review Grant 7,071,011 - Lin July 4, 2 | 2006-07-04 |
| Inspection methods for a semiconductor device App 20060134812 - Lin; Long-Hui ; et al. | 2006-06-22 |
| Method of building a defect database Grant 7,020,536 - Lin , et al. March 28, 2 | 2006-03-28 |
| Method Of Defect Inspection App 20050248756 - Lin, Long-Hui ; et al. | 2005-11-10 |
| Method Of Building A Defect Database App 20050177264 - Lin, Long-Hui ; et al. | 2005-08-11 |
| Method Of Defect Review App 20050159909 - Lin, Long-Hui | 2005-07-21 |
| Method Of Defect Control App 20050080572 - Lin, Long-Hui | 2005-04-14 |
| Method Of Defect Root Cause Analysis App 20050049836 - Lin, Long-Hui | 2005-03-03 |
| Method of piping defect detection Grant 6,825,119 - Lin November 30, 2 | 2004-11-30 |
| Method for automatically controlling defect -specification in a semiconductor manufacturing process Grant 6,807,454 - Wang , et al. October 19, 2 | 2004-10-19 |
| Method For Automatically Controlling Defect -specification In A Semiconductor Manufacturing Process App 20030212469 - Wang, Sheng-Jen ; et al. | 2003-11-13 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 