Lin; Jason Z.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lin; Jason Z..The latest application filed is for "method and system for mixed mode wafer inspection".
- Lin; Jason Z. - Saratoga CA
| Patent | Date |
|---|---|
| Method And System For Mixed Mode Wafer Inspection App 20220230293 - Lin; Jason Z. ; et al. | 2022-07-21 |
| Method and system for mixed mode wafer inspection Grant 11,295,438 - Lin , et al. April 5, 2 | 2022-04-05 |
| Method and System for Mixed Mode Wafer Inspection App 20190108630 - Lin; Jason Z. ; et al. | 2019-04-11 |
| Method and system for mixed mode wafer inspection Grant 10,192,303 - Lin , et al. Ja | 2019-01-29 |
| Detection of defects embedded in noise for inspection in semiconductor manufacturing Grant 9,916,653 - Lin March 13, 2 | 2018-03-13 |
| Method and System for Mixed Mode Wafer Inspection App 20140153814 - Lin; Jason Z. ; et al. | 2014-06-05 |
| Methods and apparatus for simultaneously inspecting multiple array regions having different pitches Grant 8,692,878 - Chen , et al. April 8, 2 | 2014-04-08 |
| Status polling Grant 8,645,100 - Bhaskar , et al. February 4, 2 | 2014-02-04 |
| Detection Of Defects Embedded In Noise For Inspection In Semiconductor Manufacturing App 20140002632 - LIN; Jason Z. | 2014-01-02 |
| Memory cell and page break inspection Grant 8,155,428 - Lin , et al. April 10, 2 | 2012-04-10 |
| Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm Grant 8,000,922 - Chen , et al. August 16, 2 | 2011-08-16 |
| Methods And Apparatus For Simultaneously Inspecting Multiple Array Regions Having Different Pitches App 20110164130 - Chen; Hong ; et al. | 2011-07-07 |
| Memory load balancing Grant 7,865,037 - Bhaskar , et al. January 4, 2 | 2011-01-04 |
| Methods And Systems For Generating Information To Be Used For Selecting Values For One Or More Parameters Of A Detection Algorithm App 20090299681 - Chen; Hong ; et al. | 2009-12-03 |
| Methods And Systems For Binning Defects Detected On A Specimen App 20090290784 - Lin; Jason Z. ; et al. | 2009-11-26 |
| Mirror node process verification Grant 7,602,958 - Bhaskar , et al. October 13, 2 | 2009-10-13 |
| Methods and systems for binning defects detected on a specimen Grant 7,570,800 - Lin , et al. August 4, 2 | 2009-08-04 |
| Daisy chained topology Grant 7,555,409 - Bhaskar , et al. June 30, 2 | 2009-06-30 |
| Memory cell and page break inspection App 20090067703 - Lin; Jason Z. ; et al. | 2009-03-12 |
| Memory cell and page break inspection App 20090067722 - Lin; Jason Z. ; et al. | 2009-03-12 |
| Image data storage Grant 7,440,640 - Bhaskar , et al. October 21, 2 | 2008-10-21 |
| Outlier substrate inspection Grant 7,440,607 - Lin , et al. October 21, 2 | 2008-10-21 |
| Programmable image computer Grant 7,379,838 - Bhaskar , et al. May 27, 2 | 2008-05-27 |
| Full swath analysis Grant 7,251,586 - Bhaskar , et al. July 31, 2 | 2007-07-31 |
| Methods and systems for binning defects detected on a specimen App 20070133860 - Lin; Jason Z. ; et al. | 2007-06-14 |
| Status Polling App 20070124095 - Bhaskar; Krishnamurthy ; et al. | 2007-05-31 |
| Inspection method and apparatus for the inspection of either random or repeating patterns Grant 7,218,768 - Evans , et al. May 15, 2 | 2007-05-15 |
| Status polling Grant 7,181,368 - Bhaskar , et al. February 20, 2 | 2007-02-20 |
| Programmable Image Computer App 20070005284 - Bhaskar; Krishnamurthy ; et al. | 2007-01-04 |
| Programmable image computer Grant 7,149,642 - Bhaskar , et al. December 12, 2 | 2006-12-12 |
| Memory load balancing Grant 7,076,390 - Bhaskar , et al. July 11, 2 | 2006-07-11 |
| Full swath analysis App 20060106580 - Bhaskar; Krishnamurthy ; et al. | 2006-05-18 |
| Full swath analysis Grant 7,024,339 - Bhaskar , et al. April 4, 2 | 2006-04-04 |
| Inspection method and apparatus for the inspection of either random or repeating patterns App 20040202361 - Evans, David M.W. ; et al. | 2004-10-14 |
| Inspection method and apparatus for the inspection of either random or repeating patterns Grant 6,665,432 - Evans , et al. December 16, 2 | 2003-12-16 |
| System and method for analyzing topological features on a surface Grant 6,137,570 - Chuang , et al. October 24, 2 | 2000-10-24 |
| Inspection method and apparatus for the inspection of either random or repeating patterns Grant 5,537,669 - Evans , et al. July 16, 1 | 1996-07-16 |
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