loadpatents
name:-0.013833045959473
name:-0.0060391426086426
name:-0.001215934753418
Lim; Jung-Taek Patent Filings

Lim; Jung-Taek

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lim; Jung-Taek.The latest application filed is for "coupled torsion beam axle for vehicles".

Company Profile
0.5.9
  • Lim; Jung-Taek - Kwangmyoung shi KR
  • Lim; Jung Taek - Gwangmyeong-si KR
  • Lim; Jung-Taek - Gyeonggi-do KR
  • Lim; Jung-Taek - Suwon-si KR
  • LIM, JUNG-TAEK - CHOONGCHEONGNAM-DO KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Trailing arm bush for coupled torsion beam axle
Grant 9,579,946 - Kim , et al. February 28, 2
2017-02-28
Coupled torsion beam axle for vehicles
Grant 9,579,947 - Kim , et al. February 28, 2
2017-02-28
Coupled Torsion Beam Axle For Vehicles
App 20160325596 - KIM; Sang Rak ;   et al.
2016-11-10
Trailing Arm Bush For Coupled Torsion Beam Axle
App 20150183290 - KIM; Sang-Rak ;   et al.
2015-07-02
Structure Of Trailing Arm For Vehicle
App 20140284121 - BAEK; Sangho ;   et al.
2014-09-25
Method and apparatus for inspecting a substrate
Grant 7,747,063 - Lim , et al. June 29, 2
2010-06-29
Method of scanning a substrate, and method and apparatus for analyzing crystal characteristics
Grant 7,626,164 - Yoon , et al. December 1, 2
2009-12-01
Methods of compensating for an alignment error during fabrication of structures on semiconductor substrates
Grant 7,498,248 - Lim , et al. March 3, 2
2009-03-03
Method Of Scanning A Substrate, And Method And Apparatus For Analyzing Crystal Characteristics
App 20070120054 - YOON; Young-Jee ;   et al.
2007-05-31
Methods of compensating for an alignment error during fabrication of structures on semiconductor substrates
App 20070120220 - Lim; Jung-Taek ;   et al.
2007-05-31
Method And Apparatus For Inspecting A Substrate
App 20070031025 - Lim; Jung-Taek ;   et al.
2007-02-08
Method Of Inspecting A Defect On A Substrate
App 20070030479 - PARK; Sung-Hong ;   et al.
2007-02-08
Image processing method
App 20060029286 - Lim; Jung-Taek ;   et al.
2006-02-09
Variable Time Etching System According To The Accumulated Number Of Devices Being Processed And A Method For Etching In The Same Manner
App 20020088774 - LIM, JUNG-TAEK ;   et al.
2002-07-11

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