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name:-0.013098955154419
name:-0.010305166244507
name:-0.0014209747314453
LIAO; Chin-Chang Patent Filings

LIAO; Chin-Chang

Patent Applications and Registrations

Patent applications and USPTO patent grants for LIAO; Chin-Chang.The latest application filed is for "conductive bump electrode structure".

Company Profile
1.10.11
  • LIAO; Chin-Chang - Zhubei City TW
  • Liao; Chin-Chang - Hsinchu County TW
  • Liao; Chin Chang - Shanghai CN
  • Liao; Chin-Chang - Taipei City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Conductive Bump Electrode Structure
App 20210368619 - LIAO; Chin-Chang ;   et al.
2021-11-25
System and method for measuring physiological signal
Grant 10,980,464 - Liao April 20, 2
2021-04-20
Physiological signal receiving apparatus and manufacturing method thereof
Grant 10,524,678 - Liao , et al. J
2020-01-07
System And Method For Measuring Physiological Signal
App 20190046060 - Liao; Chin-Chang
2019-02-14
Physiological Signal Receiving Apparatus And Manufacturing Method Thereof
App 20180263525 - Liao; Chin-Chang ;   et al.
2018-09-20
System and method for test structure on a wafer
Grant 9,472,476 - Ping , et al. October 18, 2
2016-10-18
System and method for I/O ESD protection with floating and/or biased polysilicon regions
Grant 8,686,507 - Su , et al. April 1, 2
2014-04-01
System And Method For Test Structure On A Wafer
App 20130193997 - Ping; Wang Jian ;   et al.
2013-08-01
Electronic Device
App 20130164588 - Liao; Chin-Chang ;   et al.
2013-06-27
System and method for test structure on a wafer
Grant 8,415,663 - Ping , et al. April 9, 2
2013-04-09
System and method for input pin ESD protection with floating and/or biased polysilicon regions
Grant 8,319,286 - Su , et al. November 27, 2
2012-11-27
System and method for I/O ESD protection with polysilicon regions fabricated by processes for making core transistors
Grant 8,283,726 - Su , et al. October 9, 2
2012-10-09
System And Method For Input Pin Esd Protection With Floating And/or Biased Polysilicon Regions
App 20120001261 - Su; Ting Chieh ;   et al.
2012-01-05
System And Method For Test Structure On A Wafer
App 20100164508 - PING; WANG JIAN ;   et al.
2010-07-01
System And Method For I/o Esd Protection With Polysilicon Regions Fabricated By Processes For Making Core Transistors
App 20100059824 - SU; TING CHIEH ;   et al.
2010-03-11
System and method for I/O ESD protection with polysilicon regions fabricated by processes for making core transistors
Grant 7,642,602 - Su , et al. January 5, 2
2010-01-05
System And Method For I/o Esd Protection With Polysilicon Regions Fabricated By Processes For Making Core Transistors
App 20070284663 - Su; Ting Chieh ;   et al.
2007-12-13
System and method for I/O ESD protection with floating and/or biased polysilicon regions
App 20070164362 - Su; Ting Chieh ;   et al.
2007-07-19

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