LIAO; Chih-Chieh
Patent Applications and Registrations
Patent applications and USPTO patent grants for LIAO; Chih-Chieh.The latest application filed is for "testing system, crack noise monitoring device and method for monitoring crack noise".
- LIAO; Chih-Chieh - HSINCHU CITY TW
- Liao; Chih-Chieh - Hsinchu TW
- Liao; Chih-Chieh - Taipei TW
- LIAO; Chih-Chieh - Taipei City TW
| Patent | Date |
|---|---|
| Testing System, Crack Noise Monitoring Device And Method For Monitoring Crack Noise App 20220293121 - LIAO; Chih-Chieh ; et al. | 2022-09-15 |
| Testing Apparatus And Its Element Pickup Module App 20220291256 - LIAO; Chih-Chieh ; et al. | 2022-09-15 |
| Thermal Peak Suppression Device App 20220270953 - LIAO; Chih-Chieh ; et al. | 2022-08-25 |
| Testing Equipment, Its Component Carrying Device And Testing Method Of The Testing Equipment App 20220178990 - LIAO; Chih-Chieh ; et al. | 2022-06-09 |
| Testing equipment, its component carrying device and testing method of the testing equipment Grant 11,340,288 - Liao , et al. May 24, 2 | 2022-05-24 |
| Inspecting Device App 20220136816 - Liao; Chih-Chieh ; et al. | 2022-05-05 |
| Testing Apparatus App 20220136724 - Liao; Chih-Chieh ; et al. | 2022-05-05 |
| Probe card module Grant 11,156,639 - Liao , et al. October 26, 2 | 2021-10-26 |
| Probe Card Module App 20210223290 - Liao; Chih-Chieh ; et al. | 2021-07-22 |
| Testing system for semiconductor package components and its thermal barrier layer element Grant 10,598,724 - Liao , et al. | 2020-03-24 |
| Drying apparatus Grant 10,566,217 - Liao , et al. Feb | 2020-02-18 |
| Testing equipment for semiconductor element and its carrying device Grant 10,502,775 - Liao , et al. Dec | 2019-12-10 |
| Drying Apparatus App 20190304810 - LIAO; Chih-Chieh ; et al. | 2019-10-03 |
| Wafer shipping device Grant 10,332,765 - Chih , et al. | 2019-06-25 |
| Probe card system, probe loader device and manufacturing method of the probe loader device Grant 10,274,516 - Liao , et al. | 2019-04-30 |
| Testing System For Semiconductor Package Components And Its Thermal Barrier Layer Element App 20190064258 - LIAO; Chih-Chieh ; et al. | 2019-02-28 |
| Testing Equipment For Semiconductor Element And Its Carrying Device App 20190064247 - LIAO; Chih-Chieh ; et al. | 2019-02-28 |
| Electronic device having active heat dissipation Grant 10,154,612 - Sun , et al. Dec | 2018-12-11 |
| Testing apparatus and its probe connector Grant 10,132,835 - Liao , et al. November 20, 2 | 2018-11-20 |
| Probe Card System, Probe Loader Device And Manufacturing Method Of The Probe Loader Device App 20180321278 - LIAO; Chih-Chieh ; et al. | 2018-11-08 |
| Probe card device Grant 10,048,290 - Liao , et al. August 14, 2 | 2018-08-14 |
| Damping component and integrated-circuit testing apparatus using the same Grant 10,041,817 - Liao , et al. August 7, 2 | 2018-08-07 |
| Damping Component And Integrated-circuit Testing Apparatus Using The Same App 20180087936 - LIAO; Chih-Chieh ; et al. | 2018-03-29 |
| Testing Apparatus And Its Probe Connector App 20180038892 - LIAO; Chih-Chieh ; et al. | 2018-02-08 |
| Probe Card Device App 20170269126 - LIAO; Chih-Chieh ; et al. | 2017-09-21 |
| Probe card Grant 9,678,110 - Liao , et al. June 13, 2 | 2017-06-13 |
| Testing Unit And Testing Apparatus Using The Same App 20170052218 - LIAO; Chih-Chieh ; et al. | 2017-02-23 |
| Circuit Probing System And Its Circuit Probing Device App 20170045554 - LIAO; Chih-Chieh ; et al. | 2017-02-16 |
| Probe Card App 20170010305 - LIAO; Chih-Chieh ; et al. | 2017-01-12 |
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