Liang; Ardis

Patent Applications and Registrations

Patent applications and USPTO patent grants for Liang; Ardis.The latest application filed is for "semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection".

Company Profile

3.6.6

Liang; Ardis - Pleasanton CA
Liang; Ardis - Fremont CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection Grant 11,055,840 - Liang , et al. July 6, 2	2021-07-06
Semiconductor Hot-Spot and Process-Window Discovery Combining Optical and Electron-Beam Inspection App 20210042908 - Liang; Ardis ; et al.	2021-02-11
System and method for defect classification based on electrical design intent Grant 10,209,628 - Uppaluri , et al. Feb	2019-02-19
Adaptive nuisance filter Grant 9,835,566 - Liang , et al. December 5, 2	2017-12-05
System and Method for Defect Classification Based on Electrical Design Intent App 20170344695 - Uppaluri; Prasanti ; et al.	2017-11-30
Adaptive Nuisance Filter App 20160258879 - Liang; Ardis ; et al.	2016-09-08
Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer Grant 8,204,296 - Bhaskar , et al. June 19, 2	2012-06-19
Methods For Generating A Standard Reference Die For Use In A Die To Standard Reference Die Inspection And Methods For Inspecting A Wafer App 20100329540 - Bhaskar; Kris ; et al.	2010-12-30
Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer Grant 7,796,804 - Bhaskar , et al. September 14, 2	2010-09-14
Methods For Generating A Standard Reference Die For Use In A Die To Standard Reference Die Inspection And Methods For Inspecting A Wafer App 20090041332 - Bhaskar; Kris ; et al.	2009-02-12
Apparatus and methods for analyzing defects on a sample Grant 7,345,753 - Bhaskar , et al. March 18, 2	2008-03-18
Apparatus and methods for analyzing defects on a sample App 20060102839 - Bhaskar; Kris ; et al.	2006-05-18

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