loadpatents
Patent applications and USPTO patent grants for LI; Zhiyang.The latest application filed is for "system and method for correcting overlay errors in a lithographic process".
Patent | Date |
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System And Method For Correcting Overlay Errors In A Lithographic Process App 20210263427 - LI; Zhiyang ;   et al. | 2021-08-26 |
Method and device for verifying consistency of data of master device and slave device Grant 10,176,213 - Cheng , et al. J | 2019-01-08 |
Method and device for 3-D display based on random constructive interference Grant 9,270,978 - Li February 23, 2 | 2016-02-23 |
Method And Device For Verifying Consistency Of Data Of Master Device And Slave Device App 20150317351 - CHENG; Bin ;   et al. | 2015-11-05 |
Method and Device for 3-D Display Based on Random Constructive Interference App 20140085427 - Li; Zhiyang | 2014-03-27 |
Method and devices for 3-D display based on random constructive interference Grant 8,624,961 - Li January 7, 2 | 2014-01-07 |
Method and Devices for 3-D Display Based on Random Constructive Interference App 20100328433 - Li; Zhiyang | 2010-12-30 |
Arrayed waveguide interferometer App 20050018947 - Li, Zhiyang | 2005-01-27 |
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