loadpatents
name:-0.01310920715332
name:-0.0065360069274902
name:-0.010459184646606
Li; Sing-Tsung Patent Filings

Li; Sing-Tsung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Li; Sing-Tsung.The latest application filed is for "under-floor charging station".

Company Profile
7.6.9
  • Li; Sing-Tsung - Taichung TW
  • LI; Sing-Tsung - Taichung City TW
  • LI; Sing-Tsung - Taichung City 40454 TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Under-floor charging station
Grant 11,437,843 - Wu , et al. September 6, 2
2022-09-06
Under-floor Charging Station
App 20210376649 - WU; Cheng-Lung ;   et al.
2021-12-02
Semiconductor Equipment Management Method, Electronic Device, And Non-transitory Computer Readable Storage Medium
App 20210063984 - Li; Sing-Tsung ;   et al.
2021-03-04
Semiconductor equipment management method, electronic device, and non-transitory computer readable storage medium
Grant 10,852,704 - Li , et al. December 1, 2
2020-12-01
Techniques for detecting micro-arcing occurring inside a semiconductor processing chamber
Grant 10,734,206 - Wu , et al.
2020-08-04
Techniques For Detecting Micro-arcing Occurring Inside A Semiconductor Processing Chamber
App 20200111652 - Wu; Feng-Kuang ;   et al.
2020-04-09
Techniques for detecting micro-arcing occurring inside a semiconductor processing chamber
Grant 10,559,453 - Wu , et al. Feb
2020-02-11
Portable noninvasive inspection device
Grant 10,390,705 - Ou-Yang , et al. A
2019-08-27
Semiconductor Equipment Management Method, Electronic Device, And Non-transitory Computer Readable Storage Medium
App 20190163149 - Li; Sing-Tsung ;   et al.
2019-05-30
Arcing Protection Method And Processing Tool
App 20190139746 - TSAI; Wun-Kai ;   et al.
2019-05-09
Techniques For Detecting Micro-arcing Occurring Inside A Semiconductor Processing Chamber
App 20190131116 - Wu; Feng-Kuang ;   et al.
2019-05-02
Techniques for detecting micro-arcing occurring inside a semiconductor processing chamber
Grant 10,170,287 - Wu , et al. J
2019-01-01
Portable Noninvasive Inspection Device
App 20160249809 - OU-YANG; MANG ;   et al.
2016-09-01
Portable Noninvasive Inspection Device
App 20150313455 - OU-YANG; Mang ;   et al.
2015-11-05
Portable Noninvasive Inspection Device
App 20150118637 - OU-YANG; MANG ;   et al.
2015-04-30

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