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Imaging Reflectometry For Inline Screening
App 20220307990 - Robinson; John Charles ; et al. | 2022-09-29 |
Battery electric vehicle energy storage system and method
Grant 11,451,071 - Dai , et al. September 20, 2 | 2022-09-20 |
Battery system and a method for use in the battery system
Grant 11,362,524 - Mituta , et al. June 14, 2 | 2022-06-14 |
Electric powertrain with multi-pack battery system
Grant 11,358,486 - Li , et al. June 14, 2 | 2022-06-14 |
Determining metrology-like information for a specimen using an inspection tool
Grant 11,221,300 - Li January 11, 2 | 2022-01-11 |
Battery Electric Vehicle Energy Storage System And Method
App 20210376619 - Dai; Fang ; et al. | 2021-12-02 |
Systems and Methods of High-Resolution Review for Semiconductor Inspection in Backend and Wafer Level Packaging
App 20210295495 - Li; Shifang | 2021-09-23 |
Determining Metrology-like Information For A Specimen Using An Inspection Tool
App 20210293724 - Li; Shifang | 2021-09-23 |
Battery System And A Method For Use In The Battery System
App 20210257843 - Mituta; Andres V. ; et al. | 2021-08-19 |
Diagnostic method for electric propulsion system with reconfigurable battery system
Grant 10,992,147 - Li , et al. April 27, 2 | 2021-04-27 |
Battery pack balancing systems and control logic for multi-pack electric-drive motor vehicles
Grant 10,981,557 - Ye , et al. April 20, 2 | 2021-04-20 |
Diagnostic Method For Electric Propulsion System With Reconfigurable Battery System
App 20210091575 - Li; Shifang ; et al. | 2021-03-25 |
Electric Powertrain With Multi-pack Battery System
App 20210078429 - Li; Shifang ; et al. | 2021-03-18 |
Active Isolation Detection Using Adaptive Bias Resistance
App 20210041505 - Fan; Yue ; et al. | 2021-02-11 |
Battery Pack Balancing Systems And Control Logic For Multi-pack Electric-drive Motor Vehicles
App 20200223422 - Ye; Shaochun ; et al. | 2020-07-16 |
Methods for reconfigurable battery charger control
Grant 10,675,991 - Hu , et al. | 2020-06-09 |
Reconfigurable vehicle seat for children
Grant 10,604,038 - Li , et al. | 2020-03-31 |
Vehicle and electrical system with dual battery modules
Grant 10,596,917 - Conlon , et al. | 2020-03-24 |
Vehicle And Electrical System With Dual Battery Modules
App 20200055404 - Conlon; Brendan M. ; et al. | 2020-02-20 |
All surface film metrology system
Grant 10,563,973 - Li , et al. Feb | 2020-02-18 |
Bonded wafer metrology
Grant 10,540,759 - Sah , et al. Ja | 2020-01-21 |
Method and apparatus for determining magnetic flux and magnetic force in a solenoid assembly
Grant 10,511,213 - Li , et al. Dec | 2019-12-17 |
Methods and apparatus for measuring height on a semiconductor wafer
Grant 10,495,446 - Li , et al. De | 2019-12-03 |
Reconfigurable Vehicle Seat For Children
App 20190359094 - LI; Shifang ; et al. | 2019-11-28 |
Methods For Reconfigurable Battery Charger Control
App 20190359067 - Hu; Yiran ; et al. | 2019-11-28 |
Remote Vehicle Spatial Awareness Notification System
App 20190337451 - Bacchus; Brent N. ; et al. | 2019-11-07 |
System with solenoid assembly and method of fault diagnosis and isolation
Grant 10,443,530 - Li , et al. Oc | 2019-10-15 |
Providing driver feedback
Grant 10,442,443 - Li , et al. Oc | 2019-10-15 |
Automatic reconfiguration and calibration of haptic seats
Grant 10,399,492 - Paraskevas , et al. Sep | 2019-09-03 |
Method for defocus detection
Grant 10,372,113 - Jiang , et al. | 2019-08-06 |
Hybrid vehicle propulsion systems and methods
Grant 10,259,448 - Bucknor , et al. | 2019-04-16 |
Method And Apparatus For Determining Magnetic Flux And Magnetic Force In A Solenoid Assembly
App 20190103797 - Li; Shifang ; et al. | 2019-04-04 |
Detection of reversion based on mass air flow sensor readings
Grant 10,125,710 - Hu , et al. November 13, 2 | 2018-11-13 |
Method and apparatus for controlling reductant injection into an exhaust gas feedstream of an internal combustion engine
Grant 10,107,165 - Sun , et al. October 23, 2 | 2018-10-23 |
Method of improving lateral resolution for height sensor using differential detection technology for semiconductor inspection and metrology
Grant 10,088,298 - Li October 2, 2 | 2018-10-02 |
Bonded Wafer Metrology
App 20180150952 - Sah; Kaushik ; et al. | 2018-05-31 |
Increasing dynamic range of a height sensor for inspection and metrology
Grant 9,958,257 - Li May 1, 2 | 2018-05-01 |
System and method for predicting a pedal position based on driver behavior and controlling one or more engine actuators based on the predicted pedal position
Grant 9,938,908 - Li , et al. April 10, 2 | 2018-04-10 |
Method for Defocus Detection
App 20180088560 - Jiang; Xuguang ; et al. | 2018-03-29 |
System and method for adjusting target actuator values of an engine using model predictive control to satisfy emissions and drivability targets and maximize fuel efficiency
Grant 9,927,780 - Sun , et al. March 27, 2 | 2018-03-27 |
System and method for determining target actuator values of an engine using model predictive control while satisfying emissions and drivability targets and maximizing fuel efficiency
Grant 9,909,481 - Sun , et al. March 6, 2 | 2018-03-06 |
Hybrid Vehicle Propulsion Systems And Methods
App 20180050686 - Atluri; Venkata Prasad ; et al. | 2018-02-22 |
Line scan knife edge height sensor for semiconductor inspection and metrology
Grant 9,885,656 - Li , et al. February 6, 2 | 2018-02-06 |
Line scan spectroscopic white light interferometry for semiconductor inspection and metrology
Grant 9,863,756 - Li January 9, 2 | 2018-01-09 |
Method And Apparatus For Controlling Reductant Injection Into An Exhaust Gas Feedstream Of An Internal Combustion Engine
App 20170370261 - Sun; Min ; et al. | 2017-12-28 |
System And Method For Predicting A Pedal Position Based On Driver Behavior And Controlling One Or More Engine Actuators Based On The Predicted Pedal Position
App 20170356350 - LI; Shifang ; et al. | 2017-12-14 |
Predictive control of ammonia storage in a selective catalytic reduction device using connectivity information
Grant 9,803,532 - Li , et al. October 31, 2 | 2017-10-31 |
All Surface Film Metrology System
App 20170278236 - Li; Shifang ; et al. | 2017-09-28 |
Method and apparatus for controlling an internal combustion engine coupled to an exhaust aftertreatment system
Grant 9,771,851 - Sun , et al. September 26, 2 | 2017-09-26 |
Systems and methods for enhancing inspection sensitivity of an inspection tool
Grant 9,747,520 - Li , et al. August 29, 2 | 2017-08-29 |
Method and apparatus to control reductant injection into an exhaust gas feedstream
Grant 9,739,190 - Li , et al. August 22, 2 | 2017-08-22 |
Method And Apparatus For Controlling An Internal Combustion Engine Coupled To An Exhaust Aftertreatment System
App 20170234199 - Sun; Min ; et al. | 2017-08-17 |
Method and apparatus for determining NOx content in an exhaust gas feedstream of an internal combustion engine
Grant 9,709,543 - Sun , et al. July 18, 2 | 2017-07-18 |
Apparatus and methods for measuring properties in a TSV structure using beam profile reflectometry
Grant 9,709,386 - Nicolaides , et al. July 18, 2 | 2017-07-18 |
System And Method For Adjusting Target Actuator Values Of An Engine Using Model Predictive Control To Satisfy Emissions And Drivability Targets And Maximize Fuel Efficiency
App 20170168466 - SUN; Min ; et al. | 2017-06-15 |
System And Method For Determining Target Actuator Values Of An Engine Using Model Predictive Control While Satisfying Emissions And Drivability Targets And Maximizing Fuel Efficiency
App 20170167347 - SUN; Min ; et al. | 2017-06-15 |
System and method for semiconductor wafer inspection and metrology
Grant 9,658,150 - Li , et al. May 23, 2 | 2017-05-23 |
Method And Apparatus To Control Reductant Injection Into An Exhaust Gas Feedstream
App 20170138237 - Li; Shifang ; et al. | 2017-05-18 |
Prediction of intake manifold pressure in an engine system
Grant 9,644,543 - Hu , et al. May 9, 2 | 2017-05-09 |
Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopy
Grant 9,640,449 - Goodwin , et al. May 2, 2 | 2017-05-02 |
Computation efficiency by diffraction order truncation
Grant 9,625,937 - Bischoff , et al. April 18, 2 | 2017-04-18 |
Increasing Dynamic Range of a Height Sensor for Inspection and Metrology
App 20170082424 - Li; Shifang | 2017-03-23 |
Method Of Improving Lateral Resolution For Height Sensor Using Differential Detection Technology For Semiconductor Inspection And Metrology
App 20170067732 - Li; Shifang | 2017-03-09 |
Predictive Control Of Ammonia Storage In A Selective Catalytic Reduction Device Using Connectivity Information
App 20170030243 - LI; SHIFANG ; et al. | 2017-02-02 |
Methods And Apparatus For Measuring Height On A Semiconductor Wafer
App 20160377412 - Li; Shifang ; et al. | 2016-12-29 |
Method and apparatus to determine rotational position of a phaser in a variable phasing system
Grant 9,494,488 - Li , et al. November 15, 2 | 2016-11-15 |
METHOD AND APPARATUS FOR DETERMINING NOx CONTENT IN AN EXHAUST GAS FEEDSTREAM OF AN INTERNAL COMBUSTION ENGINE
App 20160327534 - Sun; Min ; et al. | 2016-11-10 |
Engine control using calculated cylinder air charge
Grant 9,482,164 - Javaherian , et al. November 1, 2 | 2016-11-01 |
Engine Control Using Calculated Cylinder Air Charge
App 20160290256 - Javaherian; Hossein ; et al. | 2016-10-06 |
Systems and Methods for Enhancing Inspection Sensitivity of an Inspection Tool
App 20160275671 - Li; Shifang ; et al. | 2016-09-22 |
Prediction Of Intake Manifold Pressure In An Engine System
App 20160237941 - Hu; Yiran ; et al. | 2016-08-18 |
Detection Of Reversion Based On Mass Air Flow Sensor Readings
App 20160237940 - Hu; Yiran ; et al. | 2016-08-18 |
System And Method For Semiconductor Wafer Inspection And Metrology
App 20160202177 - LI; Shifang ; et al. | 2016-07-14 |
Line Scan Knife Edge Height Sensor For Semiconductor Inspection And Metrology
App 20160178514 - LI; Shifang ; et al. | 2016-06-23 |
Method And Apparatus To Determine Rotational Position Of A Phaser In A Variable Phasing System
App 20160025595 - Li; Shifang ; et al. | 2016-01-28 |
Automated Inline Inspection of Wafer Edge Strain Profiles Using Rapid Photoreflectance Spectroscopy
App 20150371910 - Goodwin; Timothy ; et al. | 2015-12-24 |
Optical metrology with multiple angles of incidence and/or azimuth angles
Grant 9,115,987 - Liu , et al. August 25, 2 | 2015-08-25 |
System for in-situ film stack measurement during etching and etch control method
Grant 9,059,038 - Li , et al. June 16, 2 | 2015-06-16 |
Optical Metrology With Multiple Angles Of Incidence And/or Azumith Angles
App 20150153165 - Liu; Zhuan ; et al. | 2015-06-04 |
Overlay measurement for a double patterning
Grant 8,980,651 - Yue , et al. March 17, 2 | 2015-03-17 |
Process control using ray tracing-based libraries and machine learning systems
Grant 8,838,422 - Li , et al. September 16, 2 | 2014-09-16 |
Method of enhancing an optical metrology system using ray tracing and flexible ray libraries
Grant 8,812,277 - Li August 19, 2 | 2014-08-19 |
System For In-situ Film Stack Measurement During Etching And Etch Control Method
App 20140024143 - LI; Shifang ; et al. | 2014-01-23 |
Method of regenerating diffraction signals for optical metrology systems
Grant 8,570,531 - Li October 29, 2 | 2013-10-29 |
Process Control Using Ray Tracing-based Libraries And Machine Learning Systems
App 20130148130 - LI; SHIFANG ; et al. | 2013-06-13 |
Method Of Regenerating Diffraction Signals For Optical Metrology Systems
App 20130151440 - LI; SHIFANG | 2013-06-13 |
Method Of Enhancing An Optical Metrology System Using Ray Tracing And Flexible Ray Libraries
App 20130151211 - LI; SHIFANG | 2013-06-13 |
Overlay Measurement For A Double Patterning
App 20130084655 - Yue; Hongyu Henry ; et al. | 2013-04-04 |
Optimization of ray tracing and beam propagation parameters
Grant 8,289,527 - Li , et al. October 16, 2 | 2012-10-16 |
Generating simulated diffraction signal using a dispersion function relating process parameter to dispersion
Grant 8,069,020 - Li , et al. November 29, 2 | 2011-11-29 |
Method Of Optical Metrology Optimization Using Ray Tracing
App 20110246141 - LI; SHIFANG | 2011-10-06 |
Optimization Of Ray Tracing And Beam Propagation Parameters
App 20110246142 - LI; SHIFANG ; et al. | 2011-10-06 |
Automated Process Control Using An Adjusted Metrology Output Signal
App 20110245955 - LI; SHIFANG ; et al. | 2011-10-06 |
System For Optical Metrology Optimization Using Ray Tracing
App 20110246400 - LI; SHIFANG | 2011-10-06 |
System and method for azimuth angle calibration
Grant 7,990,534 - Li August 2, 2 | 2011-08-02 |
Optimizing sensitivity of optical metrology measurements
Grant 7,961,306 - Li , et al. June 14, 2 | 2011-06-14 |
Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology
Grant 7,949,490 - Liu , et al. May 24, 2 | 2011-05-24 |
Pre-aligned metrology system and modules
Grant 7,940,391 - Li May 10, 2 | 2011-05-10 |
Determining profile parameters of a structure formed on a semiconductor wafer using a dispersion function relating process parameter to dispersion
Grant 7,912,679 - Li , et al. March 22, 2 | 2011-03-22 |
Optimizing Sensitivity Of Optical Metrology Measurements
App 20100245807 - LI; SHIFANG ; et al. | 2010-09-30 |
Field replaceable units (FRUs) optimized for integrated metrology (IM)
Grant 7,742,163 - Li June 22, 2 | 2010-06-22 |
Noise-reduction metrology models
Grant 7,742,177 - Li , et al. June 22, 2 | 2010-06-22 |
Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology
Grant 7,729,873 - Liu , et al. June 1, 2 | 2010-06-01 |
Determining one or more profile parameters of a photomask covered by a pellicle
Grant 7,702,471 - Li , et al. April 20, 2 | 2010-04-20 |
Computation Efficiency By Diffraction Order Truncation
App 20100042388 - Bischoff; Joerg ; et al. | 2010-02-18 |
Field Replaceable Units (FRUs) Optimized for Integrated Metrology (IM)
App 20100007875 - Li; Shifang | 2010-01-14 |
Pre-Aligned Metrology System and Modules
App 20100007885 - Li; Shifang | 2010-01-14 |
System and Method for Azimuth Angle Calibration
App 20100010765 - Li; Shifang | 2010-01-14 |
Determining transmittance of a photomask using optical metrology
Grant 7,639,375 - Yedur , et al. December 29, 2 | 2009-12-29 |
Automated process control using optical metrology with a photonic nanojet
Grant 7,639,351 - Chen , et al. December 29, 2 | 2009-12-29 |
Automated process control of a fabrication tool using a dispersion function relating process parameter to dispersion
Grant 7,636,649 - Li , et al. December 22, 2 | 2009-12-22 |
Automated process control using parameters determined with approximation and fine diffraction models
Grant 7,627,392 - Liu , et al. December 1, 2 | 2009-12-01 |
Library accuracy enhancment and evaluation
Grant 7,617,075 - Li , et al. November 10, 2 | 2009-11-10 |
Optical metrology model optimization based on goals
Grant 7,588,949 - Vuong , et al. September 15, 2 | 2009-09-15 |
Controlling a fabrication tool using support vector machine
Grant 7,567,352 - Jin , et al. July 28, 2 | 2009-07-28 |
Noise-Reduction Metrology Models
App 20090187383 - Li; Shifang ; et al. | 2009-07-23 |
Determining position accuracy of double exposure lithography using optical metrology
Grant 7,523,439 - Wen , et al. April 21, 2 | 2009-04-21 |
Weighting function to enhance measured diffraction signals in optical metrology
Grant 7,523,021 - Vuong , et al. April 21, 2 | 2009-04-21 |
Modeling and measuring structures with spatially varying properties in optical metrology
Grant 7,515,282 - Li , et al. April 7, 2 | 2009-04-07 |
Optical metrology using a support vector machine with simulated diffraction signal inputs
Grant 7,511,835 - Jin , et al. March 31, 2 | 2009-03-31 |
Automated Process Control Of A Fabrication Tool Using A Dispersion Function Relating Process Parameter To Dispersion
App 20090082993 - LI; SHIFANG ; et al. | 2009-03-26 |
Determining Profile Parameters Of A Structure Formed On A Semiconductor Wafer Using A Dispersion Function Relating Process Parameter To Dispersion
App 20090083013 - LI; SHIFANG ; et al. | 2009-03-26 |
Generating Simulated Diffraction Signal Using A Dispersion Function Relating Process Parameter To Dispersion
App 20090076782 - LI; SHIFANG ; et al. | 2009-03-19 |
Automated Process Control Using Parameters Determined With Approximation And Fine Diffraction Models
App 20090063077 - LIU; WEI ; et al. | 2009-03-05 |
Determining Profile Parameters Of A Structure Using Approximation And Fine Diffraction Models In Optical Metrology
App 20090063075 - LIU; WEI ; et al. | 2009-03-05 |
Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology
App 20090063076 - LIU; WEI ; et al. | 2009-03-05 |
Optical metrology using support vector machine with profile parameter inputs
Grant 7,483,809 - Jin , et al. January 27, 2 | 2009-01-27 |
Automated process control using parameters determined from a photomask covered by a pellicle
Grant 7,480,062 - Li , et al. January 20, 2 | 2009-01-20 |
In-die optical metrology
Grant 7,474,420 - Li , et al. January 6, 2 | 2009-01-06 |
Determining One Or More Profile Parameters Of A Photomask Covered By A Pellicle
App 20080291467 - LI; SHIFANG ; et al. | 2008-11-27 |
Automated Process Control Using Parameters Determined From A Photomask Covered By A Pellicle
App 20080291429 - LI; SHIFANG ; et al. | 2008-11-27 |
Examining a structure formed on a semiconductor wafer using machine learning systems
Grant 7,453,584 - Li , et al. November 18, 2 | 2008-11-18 |
Generic interface for an optical metrology system
Grant 7,450,232 - Li , et al. November 11, 2 | 2008-11-11 |
Controlling A Fabrication Tool Using Support Vector Machine
App 20080252908 - JIN; Wen ; et al. | 2008-10-16 |
Optical metrology using support vector machine with profile parameter inputs
App 20080255786 - Jin; Wen ; et al. | 2008-10-16 |
Optical metrology using a support vector machine with simulated diffraction signal inputs
App 20080255801 - Jin; Wen ; et al. | 2008-10-16 |
Automated process control using optical metrology with a photonic nanojet
App 20080231863 - Chen; Zhigang ; et al. | 2008-09-25 |
Optimization of diffraction order selection for two-dimensional structures
Grant 7,428,060 - Jin , et al. September 23, 2 | 2008-09-23 |
Azimuthal scanning of a structure formed on a semiconductor wafer
Grant 7,414,733 - Bischoff , et al. August 19, 2 | 2008-08-19 |
Optical Metrology Model Optimization For Repetitive Structures
App 20080195342 - LI; Shifang ; et al. | 2008-08-14 |
Optical metrology using a photonic nanojet
Grant 7,394,535 - Chen , et al. July 1, 2 | 2008-07-01 |
Determining transmittance of a photomask using optical metrology
App 20080144919 - Yedur; Sanjay ; et al. | 2008-06-19 |
Controlling a fabrication tool using support vector machine
Grant 7,372,583 - Jin , et al. May 13, 2 | 2008-05-13 |
Optical metrology model optimization for repetitive structures
Grant 7,355,728 - Li , et al. April 8, 2 | 2008-04-08 |
Library Accuracy Enhancment And Evaluation
App 20080071504 - Li; Shifang ; et al. | 2008-03-20 |
Generic Interface For An Optical Metrology System
App 20080037017 - Li; Shifang ; et al. | 2008-02-14 |
Examining A Structure Formed On A Semiconductor Wafer Using Machine Learning Systems
App 20080033683 - LI; Shifang ; et al. | 2008-02-07 |
Determining position accuracy of double exposure lithography using optical metrology
App 20080016487 - Wen; Youxian ; et al. | 2008-01-17 |
Generating a profile model to characterize a structure to be examined using optical metrology
App 20080013107 - Chard; Jeffrey A. ; et al. | 2008-01-17 |
Library accuracy enhancement and evaluation
Grant 7,302,367 - Li , et al. November 27, 2 | 2007-11-27 |
Azimuthal scanning of a structure formed on a semiconductor wafer
App 20070236705 - Bischoff; Joerg ; et al. | 2007-10-11 |
Examining a structure formed on a semiconductor wafer using machine learning systems
Grant 7,280,229 - Li , et al. October 9, 2 | 2007-10-09 |
In-die optical metrology
App 20070229855 - Li; Shifang ; et al. | 2007-10-04 |
Optimization of diffraction order selection for two-dimensional structures
App 20070223011 - Jin; Wen ; et al. | 2007-09-27 |
Library accuracy enhancement and evaluation
App 20070225940 - Li; Shifang ; et al. | 2007-09-27 |
Generic interface for an optical metrology system
Grant 7,271,902 - Li , et al. September 18, 2 | 2007-09-18 |
Weighting function to enhance measured diffraction signals in optical metrology
App 20070211260 - Vuong; Vi ; et al. | 2007-09-13 |
Optical metrology model optimization based on goals
App 20070135959 - Vuong; Vi ; et al. | 2007-06-14 |
Azimuthal scanning of a structure formed on a semiconductor wafer
Grant 7,224,471 - Bischoff , et al. May 29, 2 | 2007-05-29 |
Modeling and measuring structures with spatially varying properties in optical metrology
App 20070002337 - Li; Shifang ; et al. | 2007-01-04 |
Optical metrology model optimization for repetitive structures
App 20060290947 - Li; Shifang ; et al. | 2006-12-28 |
Generic interface for an optical metrology system
App 20060244966 - Li; Shifang ; et al. | 2006-11-02 |
Selecting unit cell configuration for repeating structures in optical metrology
App 20060187466 - Li; Shifang ; et al. | 2006-08-24 |
Generic interface for an optical metrology system
Grant 7,064,829 - Li , et al. June 20, 2 | 2006-06-20 |
Examining a structure formed on a semiconductor wafer using machine learning systems
App 20060119863 - Li; Shifang ; et al. | 2006-06-08 |
Miniature 1.times.2 magneto-optic switch
Grant 7,035,497 - Li , et al. April 25, 2 | 2006-04-25 |
Optical metrology model optimization based on goals
App 20060064280 - Vuong; Vi ; et al. | 2006-03-23 |
Miniature magneto-optic fiber optical switch
Grant 6,944,363 - Li , et al. September 13, 2 | 2005-09-13 |
Optical circulator
Grant 6,895,129 - Liu , et al. May 17, 2 | 2005-05-17 |
Azimuthal scanning of a structure formed on a semiconductor wafer
App 20050088665 - Bischoff, Joerg ; et al. | 2005-04-28 |
Miniature 2.times.2 magneto-optic switch
Grant 6,879,746 - Li , et al. April 12, 2 | 2005-04-12 |
Multiple optical switches using refractive optics
Grant 6,873,757 - Li , et al. March 29, 2 | 2005-03-29 |
Miniature magneto-optic fiber optical switch
App 20050041908 - Li, Shifang ; et al. | 2005-02-24 |
Generic interface for an optical metrology system
App 20040184035 - Li, Shifang ; et al. | 2004-09-23 |
Miniature 1x2 magneto-optic switch
App 20040081392 - Li, Shifang ; et al. | 2004-04-29 |
Miniature 2x2 magneto-optic switch
App 20040081387 - Li, Shifang ; et al. | 2004-04-29 |
Multiple optical switches using refractive optics
App 20030223680 - Li, Shifang ; et al. | 2003-12-04 |
Optical circulator
App 20030202729 - Liu, Zhimin ; et al. | 2003-10-30 |
Cascaded filter employing an AOTF and narrowband birefringent filters
Grant 6,624,889 - Li September 23, 2 | 2003-09-23 |
Universal endoscope video adaptor with zoom
Grant 6,155,973 - Howes , et al. December 5, 2 | 2000-12-05 |
Endoscope video adapter with zoom
Grant 6,113,533 - Howes , et al. September 5, 2 | 2000-09-05 |
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