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Patent applications and USPTO patent grants for Leviant; Tom.The latest application filed is for "accuracy improvements in optical metrology".
Patent | Date |
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System and method for application of harmonic detectivity as a quality indicator for imaging-based overlay measurements Grant 11,360,397 - Drachuck , et al. June 14, 2 | 2022-06-14 |
Accuracy Improvements In Optical Metrology App 20210175132 - Bringoltz; Barak ;   et al. | 2021-06-10 |
System And Method For Application Of Harmonic Detectivity As A Quality Indicator For Imaging-based Overlay Measurements App 20210080839 - Drachuck; Gil ;   et al. | 2021-03-18 |
Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology Grant 10,831,108 - Marciano , et al. November 10, 2 | 2020-11-10 |
Accuracy Improvements In Optical Metrology App 20180047646 - Bringoltz; Barak ;   et al. | 2018-02-15 |
Methods Of Analyzing And Utilizing Landscapes To Reduce Or Eliminate Inaccuracy In Overlay Optical Metrology App 20160313658 - Marciano; Tal ;   et al. | 2016-10-27 |
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