Levi; Shimon

Patent Applications and Registrations

Patent applications and USPTO patent grants for Levi; Shimon.The latest application filed is for "method, system and computer program product for 3d-nand cdsem metrology".

Company Profile

5.9.9

Levi; Shimon - Kiryat Tivon IL
Levi; Shimon - Tivon IL
Levi; Shimon - West Hills CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Measuring height difference in patterns on semiconductor wafers Grant 11,301,983 - Schwarzband , et al. April 12, 2	2022-04-12
Method, System And Computer Program Product For 3d-nand Cdsem Metrology App 20210383529 - KRIS; Roman ; et al.	2021-12-09
Measuring Height Difference In Patterns On Semiconductor Wafers App 20200380668 - Schwarzband; Ishai ; et al.	2020-12-03
Measuring height difference in patterns on semiconductor wafers Grant 10,748,272 - Schwarzband , et al. A	2020-08-18
Method for monitoring nanometric structures Grant 10,731,979 - Levi , et al.	2020-08-04
Method For Monitoring Nanometric Structures App 20190219390 - LEVI; Shimon ; et al.	2019-07-18
Technique for measuring overlay between layers of a multilayer structure Grant 10,354,376 - Weinberg , et al. July 16, 2	2019-07-16
Measuring Height Difference In Patterns On Semiconductor Wafers App 20180336675 - SCHWARZBAND; Ishai ; et al.	2018-11-22
Technique For Measuring Overlay Between Layers Of A Multilayer Structure App 20180268539 - WEINBERG; Yakov ; et al.	2018-09-20
Technique for measuring overlay between layers of a multilayer structure Grant 9,916,652 - Weinberg , et al. March 13, 2	2018-03-13
Technique For Measuring Overlay Between Layers Of A Multilayer Structure App 20170243343 - WEINBERG; Yakov ; et al.	2017-08-24
Technique For Measuring Overlay Between Layers Of A Multilayer Structure App 20170018066 - WEINBERG; Yakov ; et al.	2017-01-19
Technique for measuring overlay between layers of a multilayer structure Grant 9,530,199 - Weinberg , et al. December 27, 2	2016-12-27
System, method and computer readable medium for detecting edges of a pattern Grant 9,165,376 - Schwartzband , et al. October 20, 2	2015-10-20
System, Method And Computer Readable Medium For Detecting Edges Of A Pattern App 20140270470 - Schwartzband; Ishai ; et al.	2014-09-18
High throughput across-wafer-variation mapping Grant 7,990,546 - Yeo , et al. August 2, 2	2011-08-02
High Throughput Across-wafer-variation Mapping App 20090021749 - Yeo; Jeong Ho ; et al.	2009-01-22
Sinuous toy Grant 5,628,667 - Levi May 13, 1	1997-05-13

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