Levasier; Leon Martin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Levasier; Leon Martin.The latest application filed is for "methods & apparatus for monitoring a lithographic manufacturing process".

Company Profile

2.30.29

Levasier; Leon Martin - Hedel NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and apparatus for monitoring a lithographic manufacturing process Grant 11,422,476 - Schmitt-Weaver , et al. August 23, 2	2022-08-23
Lithographic apparatus Grant 10,935,895 - Koevoets , et al. March 2, 2	2021-03-02
Methods & Apparatus For Monitoring A Lithographic Manufacturing Process App 20210018847 - SCHMITT-WEAVER; Emil Peter ; et al.	2021-01-21
Methods and apparatus for monitoring a lithographic manufacturing process Grant 10,866,527 - Schmitt-Weaver , et al. December 15, 2	2020-12-15
Methods & Apparatus For Monitoring A Lithographic Manufacturing Process App 20200004164 - SCHMITT-WEAVER; Emil Peter ; et al.	2020-01-02
Lithographic Apparatus App 20190369508 - KOEVOETS; Adrianus Hendrik ; et al.	2019-12-05
Lithographic Apparatus App 20180173116 - KOEVOETS; Adrianus Hendrik ; et al.	2018-06-21
Method for compensating for an exposure error, a device manufacturing method, a substrate table, a lithographic apparatus, a control system, a method for measuring reflectivity and a method for measuring a dose of EUV radiation Grant 9,983,489 - Berendsen , et al. May 29, 2	2018-05-29
Method For Compensating for an Exposure Error, a Device Manufacturing Method, a Substrate Table, a Lithographic Apparatus, a Control System, a Method for Measuring Reflectivity and a Method for Measuring a Dose of EUV Radiation App 20170115578 - BERENDSEN; Christianus Wilhelmus Johannes ; et al.	2017-04-27
Support Structure, Method of Controlling the Temperature Of The Same, and Apparatuses Including the Same App 20160035605 - SCHMITZ; Roger Wilhelmus Antonius Henricus ; et al.	2016-02-04
Lithographic apparatus and device manufacturing method Grant 8,797,504 - Nienhuys , et al. August 5, 2	2014-08-05
Lithographic apparatus and device manufacturing method Grant 8,730,448 - Nienhuys , et al. May 20, 2	2014-05-20
Lithographic apparatus and device manufacturing method Grant 8,514,365 - De Jong , et al. August 20, 2	2013-08-20
Device manufacturing method, lithographic apparatus and a computer program Grant 8,477,287 - Oudshoorn , et al. July 2, 2	2013-07-02
Lithographic apparatus and method for calibrating the same Grant 8,368,902 - Loopstra , et al. February 5, 2	2013-02-05
Radiation beam modification apparatus and method Grant 8,351,022 - De Boeij , et al. January 8, 2	2013-01-08
Lithographic apparatus and device manufacturing method Grant 8,289,498 - Loopstra , et al. October 16, 2	2012-10-16
Lithographic Apparatus And Device Manufacturing Method App 20120229783 - Nienhuys; Han-Kwang ; et al.	2012-09-13
Lithographic Apparatus And Device Manufacturing Method App 20120229782 - Nienhuys; Han-Kwang ; et al.	2012-09-13
Method for Calibrating a Target Surface of a Position Measurement System, Position Measurement System, and Lithographic Apparatus App 20120078561 - KNIJN; Paulus Johannes ; et al.	2012-03-29
Lithographic Apparatus And Method For Calibrating The Same App 20110075154 - LOOPSTRA; Erik Roelof ; et al.	2011-03-31
Lithographic apparatus and method for calibrating the same Grant 7,880,901 - Loopstra , et al. February 1, 2	2011-02-01
Lithographic apparatus and method for calibrating the same Grant 7,859,686 - Loopstra , et al. December 28, 2	2010-12-28
Radiation Beam Modification Apparatus and Method App 20100315612 - DE BOEIJ; Wilhelmus Petrus ; et al.	2010-12-16
Device Manufacturing Method, Lithographic Apparatus and a Computer Program App 20100231890 - Oudshoorn; Alex ; et al.	2010-09-16
Lithographic Apparatus And Method For Calibrating The Same App 20100220335 - LOOPSTRA; Erik Roelof ; et al.	2010-09-02
Lithographic Apparatus And Device Manufacturing Method App 20100002207 - LOOPSTRA; Erik Roelof ; et al.	2010-01-07
Lithographic Apparatus And Method For Calibrating The Same App 20090207422 - LOOPSTRA; Erik Roelof ; et al.	2009-08-20
Lithographic apparatus and method for manufacturing a device Grant 7,542,127 - Sengers , et al. June 2, 2	2009-06-02
Lithographic apparatus and method for calibrating the same Grant 7,528,965 - Loopstra , et al. May 5, 2	2009-05-05
Lithographic apparatus and device manufacturing method App 20080297744 - Eduard De Jong; Frederik ; et al.	2008-12-04
Lithographic apparatus and method for calibrating the same Grant 7,408,655 - Loopstra , et al. August 5, 2	2008-08-05
Lithographic apparatus and method for calibrating the same App 20080074681 - Loopstra; Erik Roelof ; et al.	2008-03-27
Lithographic apparatus and method for calibrating the same App 20070256471 - Loopstra; Erik Roelof ; et al.	2007-11-08
Lithographic apparatus and method for calibrating the same Grant 7,292,312 - Loopstra , et al. November 6, 2	2007-11-06
Lithographic apparatus, position quantity detection system and method Grant 7,271,917 - Van Donkelaar , et al. September 18, 2	2007-09-18
Lithographic apparatus and method for calibrating the same Grant 7,256,871 - Loopstra , et al. August 14, 2	2007-08-14
Using unflatness information of the substrate table or mask table for decreasing overlay Grant 7,239,368 - Oesterholt , et al. July 3, 2	2007-07-03
Lithographic apparatus and method for manufacturing a device App 20070139629 - Sengers; Timotheus Franciscus ; et al.	2007-06-21
Lithographic apparatus, projection system, method of projecting and device manufacturing method Grant 7,170,580 - Leenders , et al. January 30, 2	2007-01-30
System and method of monitoring and diagnosing system condition and performance App 20070002295 - Reuhman-Huisken; Maria Elisabeth ; et al.	2007-01-04
Lithographic apparatus, position quantity detection system and method App 20060250617 - Donkelaar; Edwin Teunis Van ; et al.	2006-11-09
Using unflatness information of the substrate table or mask table for decreasing overlay App 20060114436 - Oesterholt; Rene ; et al.	2006-06-01
Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby Grant 7,002,667 - Levasier , et al. February 21, 2	2006-02-21
Lithographic apparatus with alignment subsystem, device manufacturing method, using alignment, and alignment structure Grant 6,995,831 - Levasier , et al. February 7, 2	2006-02-07
Lithographic apparatus and method for calibrating the same App 20060023194 - Loopstra; Erik Roelof ; et al.	2006-02-02
Lithographic apparatus and method for calibrating the same App 20060023178 - Loopstra; Erik Roelof ; et al.	2006-02-02
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby Grant 6,955,074 - Levasier , et al. October 18, 2	2005-10-18
Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby App 20050146699 - Levasier, Leon Martin ; et al.	2005-07-07
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby App 20050138988 - Levasier, Leon Martin ; et al.	2005-06-30
Lithographic apparatus, projection system, method of projecting and device manufacturing method App 20040257549 - Leenders, Martinus Hendrikus Antonius ; et al.	2004-12-23
Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby App 20040179184 - Levasier, Leon Martin ; et al.	2004-09-16
Method for calibrating a lithographic projection apparatus and apparatus capable of applying such a method Grant 6,710,849 - Kwan , et al. March 23, 2	2004-03-23
Method for calibrating a lithographic projection apparatus and apparatus capable of applying such a method App 20020026878 - Kwan, Yim Bun Patrick ; et al.	2002-03-07

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.