LEU; IYUN

Patent Applications and Registrations

Patent applications and USPTO patent grants for LEU; IYUN.The latest application filed is for "method for performing smart semiconductor wafer defect calibration".

Company Profile

4.16.22

LEU; IYUN - HSINCHU CITY TW
Leu; Iyun - Hsinchu TW
Leu; Iyun - Hsinchu County TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Smart Conversion And Calibration Of Coordinate App 20210231580 - LEU; IYUN ; et al.	2021-07-29
Smart Coordinate Conversion And Calibration System In Semiconductor Wafer Manufacturing App 20210231582 - LEU; Iyun ; et al.	2021-07-29
Smart Defect Calibration System In Semiconductor Wafer Manufacturing App 20210231584 - LEU; IYUN ; et al.	2021-07-29
Method For Smart Conversion And Calibration Of Coordinate App 20210231579 - LEU; IYUN ; et al.	2021-07-29
Smart Coordinate Conversion And Calibration System In Semiconductor Wafer Manufacturing App 20210231583 - LEU; IYUN ; et al.	2021-07-29
Method For Performing Smart Semiconductor Wafer Defect Calibration App 20210231581 - LEU; IYUN ; et al.	2021-07-29
Smart defect calibration system and the method thereof Grant 11,016,035 - Leu May 25, 2	2021-05-25
Semiconductor Fab's defect operating system and method thereof Grant 10,726,192 - Leu , et al.	2020-07-28
Method and system for quickly diagnosing, classifying, and sampling in-line defects based on CAA pre-diagnosis database Grant 10,719,655 - Leu	2020-07-21
Semiconductor Fab's Defect Operating System And Method Thereof App 20200026819 - LEU; Iyun ; et al.	2020-01-23
Intelligent CAA failure pre-diagnosis method and system for design layout Grant 10,409,924 - Leu Sept	2019-09-10
Method and system for intelligent weak pattern diagnosis, and non-transitory computer-readable storage medium Grant 10,312,164 - Leu	2019-06-04
Smart Defect Calibration System And The Method Thereof App 20190086340 - LEU; IYUN	2019-03-21
Method and system for intelligent defect classification and sampling, and non-transitory computer-readable storage device Grant 10,228,421 - Leu	2019-03-12
Method And System For Quickly Diagnosing, Classifying, And Sampling In-line Defects Based On Caa Pre-diagnosis Database App 20190026419 - LEU; IYUN	2019-01-24
Intelligent Caa Failure Pre-diagnosis Method And System For Design Layout App 20180293334 - LEU; IYUN	2018-10-11
Method And System For Intelligent Defect Classification And Sampling, And Non-transitory Computer-readable Storage Device App 20170212168 - LEU; IYUN	2017-07-27
Integrated interfacing system and method for intelligent defect yield solutions Grant 9,129,237 - Leu September 8, 2	2015-09-08
Method for building rule of thumb of defect classification, and methods for classifying defect and judging killer defect based on rule of thumb and critical area analysis Grant 8,908,957 - Leu December 9, 2	2014-12-09
Method And System For Intelligent Weak Pattern Diagnosis, And Non-transitory Computer-readable Storage Medium App 20140343884 - LEU; IYUN	2014-11-20
Intelligent defect diagnosis method Grant 8,607,169 - Leu December 10, 2	2013-12-10
Method For Building Rule Of Thumb Of Defect Classification, And Methods For Classifying Defect And Judging Killer Defect Based On Rule Of Thumb And Critical Area Analysis App 20130170733 - LEU; IYUN	2013-07-04
Intelligent Defect Diagnosis Method App 20130174102 - LEU; IYUN	2013-07-04
Integrated Interfacing System And Method For Intelligent Defect Yield Solutions App 20130173041 - LEU; IYUN	2013-07-04
Method for utilizing fabrication defect of an article Grant 8,473,223 - Leu June 25, 2	2013-06-25
Method for smart defect screen and sample Grant 8,312,401 - Leu , et al. November 13, 2	2012-11-13
Method For Smart Defect Screen And Sample App 20120185818 - Leu; Iyun ; et al.	2012-07-19
Method for defect diagnosis and management Grant 8,095,895 - Leu January 10, 2	2012-01-10
Method For Utilizing Fabrication Defect Of An Article App 20110082650 - LEU; IYUN	2011-04-07
Method For Simulating Leakage Distribution Of Integrated Circuit Design App 20100332206 - Leu; Iyun	2010-12-30
Method for defect diagnosis and management App 20100180239 - Leu; Iyun	2010-07-15

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