Lesoine; John
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lesoine; John.The latest application filed is for "bandgap measurements of patterned film stacks using spectroscopic metrology".
- Lesoine; John - Milpitas CA
- Lesoine; John - San Jose CA
| Patent | Date |
|---|---|
| Bandgap measurements of patterned film stacks using spectroscopic metrology Grant 11,378,451 - Wang , et al. July 5, 2 | 2022-07-05 |
| Metrology system calibration refinement Grant 10,605,722 - Kwak , et al. | 2020-03-31 |
| Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology App 20190041266 - Wang; Tianhan ; et al. | 2019-02-07 |
| Metrology System Calibration Refinement App 20180100796 - Kwak; Hidong ; et al. | 2018-04-12 |
| Metrology system calibration refinement Grant 9,857,291 - Kwak , et al. January 2, 2 | 2018-01-02 |
| Metrology System Calibration Refinement App 20140340682 - Kwak; Hidong ; et al. | 2014-11-20 |
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