Leslie; Brian C.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Leslie; Brian C..The latest application filed is for "multiple directional scans of test structures on semiconductor integrated circuits".

Company Profile

0.10.9

Leslie; Brian C. - Cupertino CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Multiple directional scans of test structures on semiconductor integrated circuits Grant 7,656,170 - Pinto , et al. February 2, 2	2010-02-02
Optical scanning system for surface inspection Grant 7,477,372 - Leslie , et al. January 13, 2	2009-01-13
Multiple Directional Scans Of Test Structures On Semiconductor Integrated Circuits App 20080237487 - Pinto; Gustavo A. ; et al.	2008-10-02
Optical Scanning System For Surface Inspection App 20070188744 - Leslie; Brian C. ; et al.	2007-08-16
Optical Scanning System for Surface Inspection App 20060203235 - Leslie; Brian C. ; et al.	2006-09-14
Optical scanning system for surface inspection Grant 7,075,637 - Leslie , et al. July 11, 2	2006-07-11
Multiple directional scans of test structures on semiconductor integrated circuits Grant 7,012,439 - Pinto , et al. March 14, 2	2006-03-14
Multiple directional scans of test structures on semiconductor integrated circuits App 20050139767 - Pinto, Gustavo A. ; et al.	2005-06-30
Scanning system for inspecting anamolies on surfaces App 20050110986 - Nikoonahad, Mehrdad ; et al.	2005-05-26
Optical scanning system for surface inspection Grant 6,888,627 - Leslie , et al. May 3, 2	2005-05-03
Multiple directional scans of test structures on semiconductor integrated circuits Grant 6,867,606 - Pinto , et al. March 15, 2	2005-03-15
Optical scanning system for surface inspection App 20030227619 - Leslie, Brian C. ; et al.	2003-12-11
Optical scanning system for surface inspection App 20030206294 - Leslie, Brian C. ; et al.	2003-11-06
Multiple directional scans of test structures on srmiconductor integrated circuits App 20030155927 - Pinto, Gustavo A. ; et al.	2003-08-21
Multiple directional scans of test structures on semiconductor integrated circuits Grant 6,566,885 - Pinto , et al. May 20, 2	2003-05-20
Methods and apparatus for optimizing semiconductor inspection tools Grant 6,433,561 - Satya , et al. August 13, 2	2002-08-13
Scanning system for inspecting anamolies on surfaces App 20020097393 - Nikoonahad, Mehrdad ; et al.	2002-07-25
Optical scanning system for surface inspection Grant 6,081,325 - Leslie , et al. June 27, 2	2000-06-27
Process for inspecting patterned wafers Grant 5,355,212 - Wells , et al. October 11, 1	1994-10-11

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