Leong; Jenn-Kuen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Leong; Jenn-Kuen.The latest application filed is for "continuous degenerate elliptical retarder for sensitive particle detection".

Company Profile

4.8.9

Leong; Jenn-Kuen - San Jose CA
Leong; Jenn-Kuen - Cupertino CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Continuous Degenerate Elliptical Retarder For Sensitive Particle Detection App 20220268710 - Liu; Xuefeng ; et al.	2022-08-25
Sensitive particle detection with spatially-varying polarization rotator and polarizer Grant 11,243,175 - Liu , et al. February 8, 2	2022-02-08
Apparatus And Method For Rotating An Optical Objective App 20210356406 - Romanovsky; Anatoly ; et al.	2021-11-18
Sensitive Particle Detection With Spatially-varying Polarization Rotator And Polarizer App 20210164918 - Liu; Xuefeng ; et al.	2021-06-03
Sensitive particle detection with spatially-varying polarization rotator and polarizer Grant 10,948,423 - Liu , et al. March 16, 2	2021-03-16
Radial polarizer for particle detection Grant 10,942,135 - Leong , et al. March 9, 2	2021-03-09
Sensitive Particle Detection with Spatially-Varying Polarization Rotator and Polarizer App 20200264109 - Liu; Xuefeng ; et al.	2020-08-20
Radial Polarizer for Particle Detection App 20200150054 - Leong; Jenn-Kuen ; et al.	2020-05-14
Wafer inspection Grant 9,291,575 - Zhao , et al. March 22, 2	2016-03-22
Wafer Inspection App 20150103348 - Zhao; Guoheng ; et al.	2015-04-16
Wafer inspection Grant 8,891,079 - Zhao , et al. November 18, 2	2014-11-18
Wafer Inspection App 20140009759 - Zhao; Guoheng ; et al.	2014-01-09
Surface inspection system using laser line illumination with two dimensional imaging Grant 7,525,649 - Leong , et al. April 28, 2	2009-04-28
Method and system using exposure control to inspect a surface Grant 6,724,473 - Leong , et al. April 20, 2	2004-04-20
Method and system using exposure control to inspect a surface App 20030223058 - Leong, Jenn-Kuen ; et al.	2003-12-04

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