Lennek; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lennek; Michael.The latest application filed is for "determining one or more characteristics of a pattern of interest on a specimen".

Company Profile

1.5.4

Lennek; Michael - Sunnyvale CA
Lennek; Michael - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Determining one or more characteristics of a pattern of interest on a specimen Grant 10,359,371 - Duffy , et al.	2019-07-23
Production sample shaping that preserves re-normalizability Grant 10,338,004 - Plihal , et al.	2019-07-02
Determining coordinates for an area of interest on a specimen Grant 10,127,653 - Duffy , et al. November 13, 2	2018-11-13
Finding patterns in a design based on the patterns and their surroundings Grant 10,062,012 - Park , et al. August 28, 2	2018-08-28
Creating defect classifiers and nuisance filters Grant 9,613,411 - Konuru , et al. April 4, 2	2017-04-04
Determining One or More Characteristics of a Pattern of Interest on a Specimen App 20170059491 - Duffy; Brian ; et al.	2017-03-02
Determining Coordinates For An Area Of Interest On A Specimen App 20160027164 - Duffy; Brian ; et al.	2016-01-28
Production Sample Shaping that Preserves Re-Normalizability App 20150276618 - Plihal; Martin ; et al.	2015-10-01
Creating Defect Classifiers and Nuisance Filters App 20150262038 - Konuru; Raghavan ; et al.	2015-09-17

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