Lei; Dengyun
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lei; Dengyun.The latest application filed is for "on-chip tddb degradation monitoring and failure early warning circuit for soc".
- Lei; Dengyun - Guangzhou CN
| Patent | Date |
|---|---|
| Method, device and system for health monitoring of system-on-chip Grant 11,231,702 - Chen , et al. January 25, 2 | 2022-01-25 |
| ESD failure early warning circuit for integrated circuit Grant 10,598,713 - Chen , et al. | 2020-03-24 |
| On-chip TDDB degradation monitoring and failure early warning circuit for SoC Grant 10,503,578 - Chen , et al. Dec | 2019-12-10 |
| System and method for health monitoring and early warning for electronic device Grant 10,458,823 - Chen , et al. Oc | 2019-10-29 |
| On-chip Tddb Degradation Monitoring And Failure Early Warning Circuit For Soc App 20190205196 - Chen; Yiqiang ; et al. | 2019-07-04 |
| System And Method For Health Monitoring And Early Warning For Electronic Device App 20190154475 - Chen; Yiqiang ; et al. | 2019-05-23 |
| Esd Failure Early Warning Circuit For Integrated Circuit App 20190079126 - Chen; Yiqiang ; et al. | 2019-03-14 |
| Method, Device And System For Health Monitoring Of System-on-chip App 20190064786 - Chen; Yiqiang ; et al. | 2019-02-28 |
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