Lega; Xavier Colonna De
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lega; Xavier Colonna De.The latest application filed is for "interferometer and method for measuring characteristics of optically unresolved surface features".
- Lega; Xavier Colonna De - Middletown CT
| Patent | Date |
|---|---|
| Interferometer And Method For Measuring Characteristics Of Optically Unresolved Surface Features App 20080266574 - Groot; Peter De ; et al. | 2008-10-30 |
| Interferometer having a coupled cavity geometry for use with an extended source App 20040012791 - Lega, Xavier Colonna De ; et al. | 2004-01-22 |
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