loadpatents
name:-0.017860174179077
name:-0.015105962753296
name:-0.0015950202941895
LEE; Wen-Long Patent Filings

LEE; Wen-Long

Patent Applications and Registrations

Patent applications and USPTO patent grants for LEE; Wen-Long.The latest application filed is for "method of using high density plasma chemical vapor deposition chamber".

Company Profile
1.15.17
  • LEE; Wen-Long - Hsinchu TW
  • LEE; Wen-Long - Hsinchu City TW
  • Lee; Wen-Long - Taipei TW
  • Lee; Wen-Long - Taipei City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method Of Using High Density Plasma Chemical Vapor Deposition Chamber
App 20220270855 - WU; Wei-Ching ;   et al.
2022-08-25
High density plasma chemical vapor deposition chamber and method of using
Grant 11,342,164 - Wu , et al. May 24, 2
2022-05-24
High Density Plasma Chemical Vapor Deposition Chamber And Method Of Using
App 20210125811 - WU; Wei-Ching ;   et al.
2021-04-29
Method of controlling an adjustable nozzle and method of making a semiconductor device
Grant 10,910,199 - Wu , et al. February 2, 2
2021-02-02
Method Of Controlling An Adjustable Nozzle And Method Of Making A Semiconductor Device
App 20180226224 - WU; Wei-Ching ;   et al.
2018-08-09
Adjustable nozzle for plasma deposition and a method of controlling the adjustable nozzle
Grant 9,941,100 - Wu , et al. April 10, 2
2018-04-10
Substrate heat treatment apparatus and heat treatment method
Grant 9,859,137 - Kuo , et al. January 2, 2
2018-01-02
Interlayer dielectric structure with high aspect ratio process (HARP)
Grant 9,716,044 - Chang , et al. July 25, 2
2017-07-25
Gate structure having spacer with flat top surface and method for forming the same
Grant 9,349,733 - Chang , et al. May 24, 2
2016-05-24
Gate Structure Having Spacer With Flat Top Surface And Method For Forming The Same
App 20150380406 - CHANG; Jen-Chi ;   et al.
2015-12-31
Substrate Heat Treatment Apparatus And Heat Treatment Method
App 20150348847 - KUO; Chun-Cha ;   et al.
2015-12-03
Profile pre-shaping for replacement poly gate interlayer dielectric
Grant 9,048,185 - Chiang , et al. June 2, 2
2015-06-02
Profile Pre-shaping For Replacement Poly Gate Interlayer Dielectric
App 20140349471 - Chiang; Chih-Wei ;   et al.
2014-11-27
Profile pre-shaping for replacement poly gate interlayer dielectric
Grant 8,803,249 - Chiang , et al. August 12, 2
2014-08-12
Profile Pre-shaping For Replacement Poly Gate Interlayer Dielectric
App 20140042553 - Chiang; Chih-Wei ;   et al.
2014-02-13
Adjustable Nozzle For Plasma Deposition And A Method Of Controlling The Adjustable Nozzle
App 20130156940 - WU; Wei-Ching ;   et al.
2013-06-20
Interlayer Dielectric Structure And Method Making The Same
App 20130043539 - Chang; Jen-Chi ;   et al.
2013-02-21
Low temperature method for minimizing copper hillock defects
Grant 7,851,358 - Wu , et al. December 14, 2
2010-12-14
Method of smoothening dielectric layer
Grant 7,635,651 - Lee , et al. December 22, 2
2009-12-22
Methods of spin-on wafer cleaning
Grant 7,611,589 - Wu , et al. November 3, 2
2009-11-03
Hillock reduction in copper films
Grant 7,368,383 - Lin , et al. May 6, 2
2008-05-06
Hillock reduction in copper films
App 20060270227 - Lin; Shih-Chi ;   et al.
2006-11-30
Low temperature method for minimizing copper hillock defects
App 20060252258 - Wu; Jun ;   et al.
2006-11-09
Methods of spin-on wafer cleaning
App 20060196526 - Wu; Jun ;   et al.
2006-09-07
Method of smoothening dielectric layer
App 20060189149 - Lee; Wen-Long ;   et al.
2006-08-24
Semiconductor Wafer Cleaning Method To Remove Residual Contamination Including Metal Nitride Particles
App 20030084919 - Tai, Yali ;   et al.
2003-05-08

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed